Reference Type | Journal (article/letter/editorial) |
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Title | Structural and Electronic Properties of Si1-xCxO2 |
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Journal | Materials Science Forum |
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Authors | Justo, João F. | Author |
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Silva, Cesar R.S. da | Author |
Pereyra, I. | Author |
Assali, Lucy V.C. | Author |
Year | 2005 (May) | Volume | 483 |
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Publisher | Trans Tech Publications, Ltd. |
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DOI | doi:10.4028/www.scientific.net/msf.483-485.577Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9858105 | Long-form Identifier | mindat:1:5:9858105:6 |
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GUID | 0 |
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Full Reference | Justo, João F., Silva, Cesar R.S. da, Pereyra, I., Assali, Lucy V.C. (2005) Structural and Electronic Properties of Si1-xCxO2. Materials Science Forum, 483. 577-580 doi:10.4028/www.scientific.net/msf.483-485.577 |
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Plain Text | Justo, João F., Silva, Cesar R.S. da, Pereyra, I., Assali, Lucy V.C. (2005) Structural and Electronic Properties of Si1-xCxO2. Materials Science Forum, 483. 577-580 doi:10.4028/www.scientific.net/msf.483-485.577 |
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In | (2005) Materials Science Forum Vol. 483. Trans Tech Publications, Ltd. |
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