Reference Type | Journal (article/letter/editorial) |
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Title | Interpretation of Profile and Intercept Counts in Microstructure Characterization |
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Journal | Materials Science Forum |
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Authors | Saxl, Ivan | Author |
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Sklenička, Vaclav | Author |
Year | 2008 (October) | Volume | 604 |
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Publisher | Trans Tech Publications, Ltd. |
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DOI | doi:10.4028/www.scientific.net/msf.604-605.403Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9867879 | Long-form Identifier | mindat:1:5:9867879:6 |
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GUID | 0 |
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Full Reference | Saxl, Ivan, Sklenička, Vaclav (2008) Interpretation of Profile and Intercept Counts in Microstructure Characterization. Materials Science Forum, 604. 403-410 doi:10.4028/www.scientific.net/msf.604-605.403 |
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Plain Text | Saxl, Ivan, Sklenička, Vaclav (2008) Interpretation of Profile and Intercept Counts in Microstructure Characterization. Materials Science Forum, 604. 403-410 doi:10.4028/www.scientific.net/msf.604-605.403 |
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In | (2008) Materials Science Forum Vol. 604. Trans Tech Publications, Ltd. |
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