Pezzotti, Giuseppe, Matsutani, Atsuo, Munisso, Maria Chiara, Zhu, Wen Liang (2008) Advanced Nano-Scale Metrology for the Characterization of Ceramic Materials in the Scanning Electron Microscope. Materials Science Forum, 606. 93-101 doi:10.4028/www.scientific.net/msf.606.93
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Advanced Nano-Scale Metrology for the Characterization of Ceramic Materials in the Scanning Electron Microscope | ||
Journal | Materials Science Forum | ||
Authors | Pezzotti, Giuseppe | Author | |
Matsutani, Atsuo | Author | ||
Munisso, Maria Chiara | Author | ||
Zhu, Wen Liang | Author | ||
Year | 2008 (October) | Volume | 606 |
Publisher | Trans Tech Publications, Ltd. | ||
DOI | doi:10.4028/www.scientific.net/msf.606.93Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9867898 | Long-form Identifier | mindat:1:5:9867898:1 |
GUID | 0 | ||
Full Reference | Pezzotti, Giuseppe, Matsutani, Atsuo, Munisso, Maria Chiara, Zhu, Wen Liang (2008) Advanced Nano-Scale Metrology for the Characterization of Ceramic Materials in the Scanning Electron Microscope. Materials Science Forum, 606. 93-101 doi:10.4028/www.scientific.net/msf.606.93 | ||
Plain Text | Pezzotti, Giuseppe, Matsutani, Atsuo, Munisso, Maria Chiara, Zhu, Wen Liang (2008) Advanced Nano-Scale Metrology for the Characterization of Ceramic Materials in the Scanning Electron Microscope. Materials Science Forum, 606. 93-101 doi:10.4028/www.scientific.net/msf.606.93 | ||
In | (2008) Materials Science Forum Vol. 606. Trans Tech Publications, Ltd. |
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