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Arzig, Matthias, Salamon, Michael, Uhlmann, Norman, Wellmann, Peter J. (2019) Tracking of the Growth Interface during PVT-Growth of SiC Boules Using a X-Ray Computed Tomography Setup. Materials Science Forum, 963. 14-17 doi:10.4028/www.scientific.net/msf.963.14

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Reference TypeJournal (article/letter/editorial)
TitleTracking of the Growth Interface during PVT-Growth of SiC Boules Using a X-Ray Computed Tomography Setup
JournalMaterials Science Forum
AuthorsArzig, MatthiasAuthor
Salamon, MichaelAuthor
Uhlmann, NormanAuthor
Wellmann, Peter J.Author
Year2019 (July)Volume963
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/msf.963.14Search in ResearchGate
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Mindat Ref. ID9892624Long-form Identifiermindat:1:5:9892624:0
GUID0
Full ReferenceArzig, Matthias, Salamon, Michael, Uhlmann, Norman, Wellmann, Peter J. (2019) Tracking of the Growth Interface during PVT-Growth of SiC Boules Using a X-Ray Computed Tomography Setup. Materials Science Forum, 963. 14-17 doi:10.4028/www.scientific.net/msf.963.14
Plain TextArzig, Matthias, Salamon, Michael, Uhlmann, Norman, Wellmann, Peter J. (2019) Tracking of the Growth Interface during PVT-Growth of SiC Boules Using a X-Ray Computed Tomography Setup. Materials Science Forum, 963. 14-17 doi:10.4028/www.scientific.net/msf.963.14
In(2019) Materials Science Forum Vol. 963. Trans Tech Publications, Ltd.

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Salamon, Michael, Arzig, Matthias, Uhlmann, Norman, Wellmann, Peter J. (2019) Advances in In Situ SiC Growth Analysis Using Cone Beam Computed Tomography. Materials Science Forum, 963. 5-9 doi:10.4028/www.scientific.net/msf.963.5
Arzig, Matthias, Salamon, Michael, Uhlmann, Norman, Johansen, Bertil A., Wellmann, Peter J. (2018) Growth Conditions and In Situ Computed Tomography Analysis of Facetted Bulk Growth of SiC Boules. Materials Science Forum, 924. 245-248 doi:10.4028/www.scientific.net/msf.924.245
Neubauer, Georg, Salamon, Michael, Uhlmann, Norman, Wellmann, Peter J. (2014) Real-Time Measurement of the Evolution of Growth Facets during SiC PVT Bulk Growth Using 3-D X-Ray Computed Tomography. Materials Science Forum, 778. 9-12 doi:10.4028/www.scientific.net/msf.778-780.9
Neubauer, Georg, Salamon, Michael, Roider, Florian, Uhlmann, Norman, Wellmann, Peter J. (2013) Application of 3-D X-Ray Computed Tomography for the In Situ Visualization of the SiC Crystal Growth Interface during PVT Bulk Growth. Materials Science Forum, 740. 27-30 doi:10.4028/www.scientific.net/msf.740-742.27
Wellmann, P.J., Fahlbusch, Lars, Salamon, Michael, Uhlmann, Norman (2016) Application of In Situ 3D Computed Tomography during PVT Growth of 4H-SiC for the Study of Source Material Consumption under Varying Growth Conditions. Materials Science Forum, 858. 49-52 doi:10.4028/www.scientific.net/msf.858.49
Steiner, Johannes, Arzig, Matthias, Hsiao, Ta Ching, Wellmann, Peter J. (2019) Optimization of the SiC Powder Source Size Distribution for the Sublimation Growth of Long Crystals Boules. Materials Science Forum, 963. 42-45 doi:10.4028/www.scientific.net/msf.963.42
Arzig, Matthias, Künecke, Ulrike, Salamon, Michael, Uhlmann, Norman, Wellmann, Peter J. (2021) Influence of the growth conditions on the formation of macro-steps on the growth interface of SiC-Crystals. Journal of Crystal Growth, 576. 126361pp. doi:10.1016/j.jcrysgro.2021.126361
Arzig, Matthias, Salamon, Michael, Hsiao, Ta Ching, Uhlmann, Norman, Wellmann, Peter J. (2020) Influence of the growth interface shape on the defect characteristics in the facet region of 4H-SiC single crystals. Journal of Crystal Growth, 532. 125436pp. doi:10.1016/j.jcrysgro.2019.125436
Schöler, Michael, Schuh, Philipp, Steiner, Johannes, Wellmann, Peter J. (2019) Modeling of the PVT Growth Process of Bulk 3C-SiC - Growth Process Development and Challenge of the Right Materials Data Base. Materials Science Forum, 963. 157-160 doi:10.4028/www.scientific.net/msf.963.157
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