Demuth, J (1985) Properties of ultrathin metallic films on Si(111) determined by high-resolution electron energy loss spectroscopy. Applied Surface Science, 22. 415-425 doi:10.1016/0169-4332(85)90073-x
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Properties of ultrathin metallic films on Si(111) determined by high-resolution electron energy loss spectroscopy | ||
Journal | Applied Surface Science | ||
Authors | Demuth, J | Author | |
Year | 1985 (May) | Volume | 22 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/0169-4332(85)90073-xSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9893923 | Long-form Identifier | mindat:1:5:9893923:5 |
GUID | 0 | ||
Full Reference | Demuth, J (1985) Properties of ultrathin metallic films on Si(111) determined by high-resolution electron energy loss spectroscopy. Applied Surface Science, 22. 415-425 doi:10.1016/0169-4332(85)90073-x | ||
Plain Text | Demuth, J (1985) Properties of ultrathin metallic films on Si(111) determined by high-resolution electron energy loss spectroscopy. Applied Surface Science, 22. 415-425 doi:10.1016/0169-4332(85)90073-x | ||
In | (n.d.) Applied Surface Science Vol. 22. Elsevier BV |
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