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Baunach, R., Spitzer, A. (1989) Simulation of charge transport and trapping in mis structures with triple-layer dielectrics. Applied Surface Science, 39. 200-209 doi:10.1016/0169-4332(89)90434-0

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Reference TypeJournal (article/letter/editorial)
TitleSimulation of charge transport and trapping in mis structures with triple-layer dielectrics
JournalApplied Surface Science
AuthorsBaunach, R.Author
Spitzer, A.Author
Year1989 (October)Volume39
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(89)90434-0Search in ResearchGate
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Mindat Ref. ID9894798Long-form Identifiermindat:1:5:9894798:8
GUID0
Full ReferenceBaunach, R., Spitzer, A. (1989) Simulation of charge transport and trapping in mis structures with triple-layer dielectrics. Applied Surface Science, 39. 200-209 doi:10.1016/0169-4332(89)90434-0
Plain TextBaunach, R., Spitzer, A. (1989) Simulation of charge transport and trapping in mis structures with triple-layer dielectrics. Applied Surface Science, 39. 200-209 doi:10.1016/0169-4332(89)90434-0
In(n.d.) Applied Surface Science Vol. 39. Elsevier BV

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Spitzer, A., Baunach, R. (1989) The physics of ONO layer dielectrics. Applied Surface Science, 39. 192-199 doi:10.1016/0169-4332(89)90433-9
Baunach, R., Spitzer, A. (1987) Interfacial tunneling barrier heights in triple-layer dielectrics. Applied Surface Science, 30. 180-185 doi:10.1016/0169-4332(87)90091-2
Kanemitsu, Yoshihiko, Imamura, Shunji (1990) Charge transport and trapping at the interface in two-layer organic photoconductors. Applied Surface Science, 41. 544-547 doi:10.1016/0169-4332(89)90119-0
Jackson, W.B. (1989) Defect kinetics in hydrogenated amorphous silicon mis structures. Applied Surface Science, 39. 273-288 doi:10.1016/0169-4332(89)90442-x
Baunach, R., Spitzer, A. (1988) Charge trapping characteristics of multilayer dielectrics in metalā€insulator semiconductor structures. Journal of Applied Physics, 64 (9). 4567-4573 doi:10.1063/1.341259
Salman, E.G., Korshunov, A.N., Vertoprakhov, V.N. (1989) A DLTS study of InAs mis structures. Applied Surface Science, 39. 141-143 doi:10.1016/0169-4332(89)90427-3
Bogdanov, S.V., Povarov, P.P., Shubin, V.E., Shushakov, D.A. (1989) Investigation of MIS structures using avalanche multiplication. Applied Surface Science, 39. 381-387 doi:10.1016/0169-4332(89)90454-6
Koch, R. (1989) Preface. Applied Surface Science, 39. doi:10.1016/0169-4332(89)90412-1
Wolters, D.R., Zegers-van Duynhoven, A.T.A. (1989) Trapping of hot electrons. Applied Surface Science, 39. 565-577 doi:10.1016/0169-4332(89)90472-8
Eisele, I. (1989) Delta-type doping profiles in silicon. Applied Surface Science, 36. 39-51 doi:10.1016/0169-4332(89)90897-0
(1989) Editorial Board. Applied Surface Science, 39. doi:10.1016/0169-4332(89)90411-x
 
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