Reference Type | Journal (article/letter/editorial) |
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Title | Rheed intensity analysis of Si(111)√3×√3-Ag structure |
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Journal | Applied Surface Science |
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Authors | Ichimiya, A. | Author |
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Kohmoto, S. | Author |
Fujii, T. | Author |
Horio, Y. | Author |
Year | 1990 (January) | Volume | 41 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(89)90037-8Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9894907 | Long-form Identifier | mindat:1:5:9894907:4 |
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GUID | 0 |
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Full Reference | Ichimiya, A., Kohmoto, S., Fujii, T., Horio, Y. (1990) Rheed intensity analysis of Si(111)√3×√3-Ag structure. Applied Surface Science, 41. 82-87 doi:10.1016/0169-4332(89)90037-8 |
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Plain Text | Ichimiya, A., Kohmoto, S., Fujii, T., Horio, Y. (1990) Rheed intensity analysis of Si(111)√3×√3-Ag structure. Applied Surface Science, 41. 82-87 doi:10.1016/0169-4332(89)90037-8 |
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In | (n.d.) Applied Surface Science Vol. 41. Elsevier BV |
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