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Förster, A., Layet, J.M., Lüth, H. (1990) Evaluation of dopant profiles and diffusion constants by means of electron energy loss spectroscopy. Applied Surface Science, 41. 306-311 doi:10.1016/0169-4332(89)90076-7

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Reference TypeJournal (article/letter/editorial)
TitleEvaluation of dopant profiles and diffusion constants by means of electron energy loss spectroscopy
JournalApplied Surface Science
AuthorsFörster, A.Author
Layet, J.M.Author
Lüth, H.Author
Year1990 (January)Volume41
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(89)90076-7Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9894946Long-form Identifiermindat:1:5:9894946:3
GUID0
Full ReferenceFörster, A., Layet, J.M., Lüth, H. (1990) Evaluation of dopant profiles and diffusion constants by means of electron energy loss spectroscopy. Applied Surface Science, 41. 306-311 doi:10.1016/0169-4332(89)90076-7
Plain TextFörster, A., Layet, J.M., Lüth, H. (1990) Evaluation of dopant profiles and diffusion constants by means of electron energy loss spectroscopy. Applied Surface Science, 41. 306-311 doi:10.1016/0169-4332(89)90076-7
In(n.d.) Applied Surface Science Vol. 41. Elsevier BV

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Förster, A., Lüth, H. (1987) Investigation of the InSb(110)-Sn Schottky barrier by means of electron energy loss spectroscopy. Surface Science Letters, 189. doi:10.1016/0167-2584(87)90458-0
Förster, A., Lüth, H. (1987) Investigation of the InSb(110)-Sn schottky barrier by means of electron energy loss spectroscopy. Surface Science, 189. 307-314 doi:10.1016/s0039-6028(87)80447-8
Layet, J.M., Contini, R., Derrien, J., Lüth, H. (1986) Coupled interface plasmons of the Ag-Si(111) system as investigated with high-resolution electron energy-loss spectroscopy. Surface Science, 168 (1). 142-148 doi:10.1016/0039-6028(86)90844-7
Li, Sung-Te, Hasegawa, Shigehiko, Yamashita, Nobuhisa, Nakashima, Hisao (1990) Initial stages of aluminum epitaxy on the Si(111)√3×√3-Al surface studied by electron-energy-loss spectroscopy. Applied Surface Science, 41. 118-122 doi:10.1016/0169-4332(89)90043-3
Ingram, Jani C., Nebesny, Kenneth W., Pemberton, Jeanne E. (1990) Optical constants of the noble metals determined by reflection electron energy loss spectroscopy. Applied Surface Science, 44. 293-300 doi:10.1016/0169-4332(90)90086-f
Layet, J.M., Contini, R., Derrien, J., Lüth, H. (1986) Coupled interface plasmons of the Ag-Si(111) system as investigated with high-resolution electron energy-loss spectroscopy. Surface Science Letters, 168 (1). doi:10.1016/0167-2584(86)90434-2
Ishii, H., Hasegawa, H., Ishii, A., Ohno, H. (1990) X-ray photo-electron spectroscopy analysis of InP insulator-semiconductor structures prepared by anodic oxidation. Applied Surface Science, 41. 390-394 doi:10.1016/0169-4332(89)90089-5
Thomas, C., Angot, T., Layet, J.-M. (2008) Investigation of D(H) abstraction by means of high resolution electron energy loss spectroscopy. Surface Science, 602 (13). 2311-2314 doi:10.1016/j.susc.2008.05.012
(1990) Editorial Board. Applied Surface Science, 41. doi:10.1016/0169-4332(89)90023-8
(1990) Conference organization. Applied Surface Science, 41. doi:10.1016/0169-4332(89)90025-1
Förster, A., Spitzer, A., Lüth, H. (1986) The adsorption of fluor-carbon complexes on GaAs(110) studied by electron energy loss spectroscopy. Surface Science, 172 (1). 174-182 doi:10.1016/0039-6028(86)90589-3
 
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