Reference Type | Journal (article/letter/editorial) |
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Title | Characterization of evaporated silicon films by inelastic electron tunneling spectroscopy |
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Journal | Applied Surface Science |
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Authors | Higo, Morihide | Author |
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Nishino, Kouichi | Author |
Kamata, Satsuo | Author |
Year | 1991 (July) | Volume | 51 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(91)90062-oSearch in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9895521 | Long-form Identifier | mindat:1:5:9895521:5 |
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GUID | 0 |
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Full Reference | Higo, Morihide, Nishino, Kouichi, Kamata, Satsuo (1991) Characterization of evaporated silicon films by inelastic electron tunneling spectroscopy. Applied Surface Science, 51. 61-69 doi:10.1016/0169-4332(91)90062-o |
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Plain Text | Higo, Morihide, Nishino, Kouichi, Kamata, Satsuo (1991) Characterization of evaporated silicon films by inelastic electron tunneling spectroscopy. Applied Surface Science, 51. 61-69 doi:10.1016/0169-4332(91)90062-o |
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In | (n.d.) Applied Surface Science Vol. 51. Elsevier BV |
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