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Guyaux, J.L., Degiovanni, A., Thiry, P.A., Sporken, R., Caudano, R. (1992) Investigation of the AlAsGaAs interface by high resolution electron energy loss spectroscopy. Applied Surface Science, 56. 697-702 doi:10.1016/0169-4332(92)90324-q

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Reference TypeJournal (article/letter/editorial)
TitleInvestigation of the AlAsGaAs interface by high resolution electron energy loss spectroscopy
JournalApplied Surface Science
AuthorsGuyaux, J.L.Author
Degiovanni, A.Author
Thiry, P.A.Author
Sporken, R.Author
Caudano, R.Author
Year1992 (January)Volume56
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(92)90324-qSearch in ResearchGate
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Mindat Ref. ID9895901Long-form Identifiermindat:1:5:9895901:7
GUID0
Full ReferenceGuyaux, J.L., Degiovanni, A., Thiry, P.A., Sporken, R., Caudano, R. (1992) Investigation of the AlAsGaAs interface by high resolution electron energy loss spectroscopy. Applied Surface Science, 56. 697-702 doi:10.1016/0169-4332(92)90324-q
Plain TextGuyaux, J.L., Degiovanni, A., Thiry, P.A., Sporken, R., Caudano, R. (1992) Investigation of the AlAsGaAs interface by high resolution electron energy loss spectroscopy. Applied Surface Science, 56. 697-702 doi:10.1016/0169-4332(92)90324-q
In(n.d.) Applied Surface Science Vol. 56. Elsevier BV

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Degiovanni, A., Guyaux, J.L., Thiry, P.A., Caudano, R. (1991) High resolution electron energy loss spectroscopy of GaAs and A1As grown by molecular beam epitaxy. Surface Science Letters, 251. doi:10.1016/0167-2584(91)90862-l
Degiovanni, A., Guyaux, J.L., Thiry, P.A., Caudano, R. (1991) High resolution electron energy loss spectroscopy of GaAs and AlAs grown by molecular beam epitaxy. Surface Science, 251. 238-242 doi:10.1016/0039-6028(91)90989-6
Yu Li-Ming, , Degiovanni, A., Conard, T., Dewandel, J.L., Thiry, P.A., Ghijsen, J., Caudano, R. (1992) Surface vibrational investigation of CuO by high resolution electron-energy-loss spectroscopy. Surface Science, 269. 1089-1095 doi:10.1016/0039-6028(92)91398-u
Guyaux, J.-L., Lambin, Ph., Lange, M.D., Sporken, R., Thiry, P.A., Caudano, R. (1996) Ultra-thin AlAs films on GaAs (001) investigated by high-resolution electron-energy-loss spectroscopy. Applied Surface Science, 104. 601-607 doi:10.1016/s0169-4332(96)00209-7
Longueville, J.L., Thiry, P.A., Ghijsen, J., Caudano, R. (1992) Vibrational properties of thin CaF2/Si(111) epitaxial layers studied by high resolution electron energy loss spectroscopy. Surface Science, 269. 152-157 doi:10.1016/0039-6028(92)91241-3
Guyaux, J.-L., Sporken, R., Thiry, P. A., Caudano, R., Lambin, Ph., Patry, L., Roy, D. (1994) Formation of the reactive interface AlSb/Sb(111) investigated by high-resolution electron-energy-loss spectroscopy. Physical Review B, 49 (12) 8054-8058 doi:10.1103/physrevb.49.8054
Thiry, P.A., Liehr, M., Pireaux, J.J., Caudano, R. (1987) Investigation of interfaces by high resolution electron energy loss spectroscopy. Surface Science Letters, 189. doi:10.1016/0167-2584(87)90466-x
Grégoire, Ch., Pireaux, J.J., Cros, A., Caudano, R. (1995) High Resolution Electron Energy Loss Spectroscopy investigation of the copper/polyphenylquinoxaline interface formation. Applied Surface Science, 84. 163-177 doi:10.1016/0169-4332(94)00472-2
Thiry, P.A., Liehr, M., Pireaux, J.J., Caudano, R. (1987) Investigation of interfaces by high resolution electron energy loss spectroscopy. Surface Science, 189. 373-378 doi:10.1016/s0039-6028(87)80455-7
Pireaux, J. J., Thiry, P. A., Sporken, R., Caudano, R. (1990) Analysis of semiconductors and insulators by high-resolution electron energy loss spectroscopy?prospects for quantification. Surface and Interface Analysis, 15 (3). 189-205 doi:10.1002/sia.740150302
Diatezua, M.D., Thiry, P.A., Terwagne, G., Caudano, R. (1992) Silicon oxinitride and aluminum films interface: Rutherford backscattering and high resolution electron-energy-loss spectroscopic studies. Surface Science, 269. 1054-1059 doi:10.1016/0039-6028(92)91392-o
 
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