Jayaram, R., Miller, M.K. (1993) An atom probe characterization of carbon-doped NiAl. Applied Surface Science, 67. 311-315 doi:10.1016/0169-4332(93)90331-5
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | An atom probe characterization of carbon-doped NiAl | ||
Journal | Applied Surface Science | ||
Authors | Jayaram, R. | Author | |
Miller, M.K. | Author | ||
Year | 1993 (April) | Volume | 67 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/0169-4332(93)90331-5Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9896470 | Long-form Identifier | mindat:1:5:9896470:9 |
GUID | 0 | ||
Full Reference | Jayaram, R., Miller, M.K. (1993) An atom probe characterization of carbon-doped NiAl. Applied Surface Science, 67. 311-315 doi:10.1016/0169-4332(93)90331-5 | ||
Plain Text | Jayaram, R., Miller, M.K. (1993) An atom probe characterization of carbon-doped NiAl. Applied Surface Science, 67. 311-315 doi:10.1016/0169-4332(93)90331-5 | ||
In | (n.d.) Applied Surface Science Vol. 67. Elsevier BV |
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