Reference Type | Journal (article/letter/editorial) |
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Title | Positron annihilation studies of defects in molecular beam epitaxy grown III–V layers |
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Journal | Applied Surface Science |
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Authors | Umlor, M.T. | Author |
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Asoka-Kumar, P. | Author |
Keeble, D.J. | Author |
Cooke, P.W. | Author |
Lynn, K.G. | Author |
Year | 1995 (January) | Volume | 85 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(94)00347-5Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9897536 | Long-form Identifier | mindat:1:5:9897536:1 |
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GUID | 0 |
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Full Reference | Umlor, M.T., Asoka-Kumar, P., Keeble, D.J., Cooke, P.W., Lynn, K.G. (1995) Positron annihilation studies of defects in molecular beam epitaxy grown III–V layers. Applied Surface Science, 85. 295-300 doi:10.1016/0169-4332(94)00347-5 |
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Plain Text | Umlor, M.T., Asoka-Kumar, P., Keeble, D.J., Cooke, P.W., Lynn, K.G. (1995) Positron annihilation studies of defects in molecular beam epitaxy grown III–V layers. Applied Surface Science, 85. 295-300 doi:10.1016/0169-4332(94)00347-5 |
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In | (n.d.) Applied Surface Science Vol. 85. Elsevier BV |
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