Reference Type | Journal (article/letter/editorial) |
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Title | Pulsed laser deposition and nanometer scale characterization of YBa2Cu3O7−δ thin films by scanning probe methods |
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Journal | Applied Surface Science |
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Authors | Sum, R. | Author |
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Lang, H.P. | Author |
Güntherodt, H.-J. | Author |
Year | 1995 (February) | Volume | 86 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(94)00389-0Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9897579 | Long-form Identifier | mindat:1:5:9897579:6 |
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GUID | 0 |
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Full Reference | Sum, R., Lang, H.P., Güntherodt, H.-J. (1995) Pulsed laser deposition and nanometer scale characterization of YBa2Cu3O7−δ thin films by scanning probe methods. Applied Surface Science, 86. 140-143 doi:10.1016/0169-4332(94)00389-0 |
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Plain Text | Sum, R., Lang, H.P., Güntherodt, H.-J. (1995) Pulsed laser deposition and nanometer scale characterization of YBa2Cu3O7−δ thin films by scanning probe methods. Applied Surface Science, 86. 140-143 doi:10.1016/0169-4332(94)00389-0 |
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In | (n.d.) Applied Surface Science Vol. 86. Elsevier BV |
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