Reference Type | Journal (article/letter/editorial) |
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Title | Atom probe analysis of carbonitride grains in (Ti, W, Ta, Mo)(C, N) () cermets with different carbon content |
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Journal | Applied Surface Science |
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Authors | Zackrisson, J. | Author |
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Thuvander, M. | Author |
Lindahl, P. | Author |
Andrén, H.-O. | Author |
Year | 1996 (March) | Volume | 94 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(95)00396-7Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9898145 | Long-form Identifier | mindat:1:5:9898145:0 |
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GUID | 0 |
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Full Reference | Zackrisson, J., Thuvander, M., Lindahl, P., Andrén, H.-O. (1996) Atom probe analysis of carbonitride grains in (Ti, W, Ta, Mo)(C, N) () cermets with different carbon content. Applied Surface Science, 94. 351-355 doi:10.1016/0169-4332(95)00396-7 |
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Plain Text | Zackrisson, J., Thuvander, M., Lindahl, P., Andrén, H.-O. (1996) Atom probe analysis of carbonitride grains in (Ti, W, Ta, Mo)(C, N) () cermets with different carbon content. Applied Surface Science, 94. 351-355 doi:10.1016/0169-4332(95)00396-7 |
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In | (n.d.) Applied Surface Science Vol. 94. Elsevier BV |
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