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Bas, P., Bostel, A., Grancher, G., Deconihout, B., Blavette, D. (1996) Analytic treatment of charge cloud overlaps: an improvement of the tomographic atom probe efficiency. Applied Surface Science, 94. 442-448 doi:10.1016/0169-4332(95)00408-4

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Reference TypeJournal (article/letter/editorial)
TitleAnalytic treatment of charge cloud overlaps: an improvement of the tomographic atom probe efficiency
JournalApplied Surface Science
AuthorsBas, P.Author
Bostel, A.Author
Grancher, G.Author
Deconihout, B.Author
Blavette, D.Author
Year1996 (March)Volume94
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(95)00408-4Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9898157Long-form Identifiermindat:1:5:9898157:5
GUID0
Full ReferenceBas, P., Bostel, A., Grancher, G., Deconihout, B., Blavette, D. (1996) Analytic treatment of charge cloud overlaps: an improvement of the tomographic atom probe efficiency. Applied Surface Science, 94. 442-448 doi:10.1016/0169-4332(95)00408-4
Plain TextBas, P., Bostel, A., Grancher, G., Deconihout, B., Blavette, D. (1996) Analytic treatment of charge cloud overlaps: an improvement of the tomographic atom probe efficiency. Applied Surface Science, 94. 442-448 doi:10.1016/0169-4332(95)00408-4
In(n.d.) Applied Surface Science Vol. 94. Elsevier BV

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Deconihout, B., Bostel, A., Bas, P., Chambreland, S., Letellier, L., Danoix, F., Blavette, D. (1994) Investigation of some selected metallurgical problems with the tomographic atom probe. Applied Surface Science, 76. 145-154 doi:10.1016/0169-4332(94)90335-2
Deconihout, B., Bostel, A., Bouet, M., Sarrau, J.M., Bas, P., Blavette, D. (1995) Performance of the multiple events position sensitive detector used in the tomographic atom probe. Applied Surface Science, 87. 428-437 doi:10.1016/0169-4332(94)00534-6
Bas, P., Bostel, A., Deconihout, B., Blavette, D. (1995) A general protocol for the reconstruction of 3D atom probe data. Applied Surface Science, 87. 298-304 doi:10.1016/0169-4332(94)00561-3
Deconihout, B., Gerard, P., Bouet, M., Bostel, A. (1996) Improvement of the detection efficiency of channel plate electron multiplier for atom probe application. Applied Surface Science, 94. 422-427 doi:10.1016/0169-4332(95)00405-x
Deconihout, B., Bostel, A., Menand, A., Sarrau, J.M., Bouet, M., Chambreland, S., Blavette, D. (1993) On the development of a 3D tomographic atom-probe. Applied Surface Science, 67. 444-450 doi:10.1016/0169-4332(93)90351-b
Sarrau, J.M., Danoix, F., Deconihout, B., Bouet, M., Menand, A., Blavette, D. (1994) The Rouen energy-compensated atom probe. Applied Surface Science, 76. 367-373 doi:10.1016/0169-4332(94)90369-7
Bigot, A., Danoix, F., Auger, P., Blavette, D., Menand, A. (1996) 3D reconstruction and analysis of GP zones in Al1.7Cu (at%): a tomographic atom probe investigation. Applied Surface Science, 94. 261-266 doi:10.1016/0169-4332(95)00384-3
Deconihout, B., Vurpillot, F., Gault, B., Da Costa, G., Bouet, M., Bostel, A., Blavette, D., Hideur, A., Martel, G., Brunel, M. (2007) Toward a laser assisted wide-angle tomographic atom-probe. Surface and Interface Analysis, 39 (2). 278-282 doi:10.1002/sia.2491
Blavette, D., Deconihout, B., Bostel, A., Sarrau, J. M., Bouet, M., Menand, A. (1993) The tomographic atom probe: A quantitative three‐dimensional nanoanalytical instrument on an atomic scale. Review of Scientific Instruments, 64 (10). 2911-2919 doi:10.1063/1.1144382
Blavette, D., Bostel, A., Sarrau, J. M., Deconihout, B., Menand, A. (1993) An atom probe for three-dimensional tomography. Nature, 363 (6428). 432-435 doi:10.1038/363432a0
Danoix, F., Grancher, G., Bostel, A., Blavette, D. (2007) Standard deviations of composition measurements in atom probe analyses—Part II: 3D atom probe. Ultramicroscopy, 107 (9). 739-743 doi:10.1016/j.ultramic.2007.02.005
 
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