Reference Type | Journal (article/letter/editorial) |
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Title | Scanning tunneling microscopy of charge transfer on the Si(111)7 Γ 7 surface |
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Journal | Applied Surface Science |
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Authors | Jeon, D. | Author |
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Hashizume, T. | Author |
Sakurai, T. | Author |
Year | 1996 (March) | Volume | 94 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-4332(95)00415-7Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9898164 | Long-form Identifier | mindat:1:5:9898164:5 |
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GUID | 0 |
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Full Reference | Jeon, D., Hashizume, T., Sakurai, T. (1996) Scanning tunneling microscopy of charge transfer on the Si(111)7 Γ 7 surface. Applied Surface Science, 94. 493-496 doi:10.1016/0169-4332(95)00415-7 |
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Plain Text | Jeon, D., Hashizume, T., Sakurai, T. (1996) Scanning tunneling microscopy of charge transfer on the Si(111)7 Γ 7 surface. Applied Surface Science, 94. 493-496 doi:10.1016/0169-4332(95)00415-7 |
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In | (n.d.) Applied Surface Science Vol. 94. Elsevier BV |
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