Reference Type | Journal (article/letter/editorial) |
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Title | Low-temperature GaAs grown by molecular-beam epitaxy under high As overpressure: a reflection high-energy electron diffraction study |
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Journal | Applied Surface Science |
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Authors | Shen, A. | Author |
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Ohno, H. | Author |
Horikoshi, Y. | Author |
Guo, S.P. | Author |
Ohno, Y. | Author |
Matsukura, F. | Author |
Year | 1998 (June) | Volume | 130 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0169-4332(98)00087-7Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9900410 | Long-form Identifier | mindat:1:5:9900410:1 |
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GUID | 0 |
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Full Reference | Shen, A., Ohno, H., Horikoshi, Y., Guo, S.P., Ohno, Y., Matsukura, F. (1998) Low-temperature GaAs grown by molecular-beam epitaxy under high As overpressure: a reflection high-energy electron diffraction study. Applied Surface Science, 130. 382-386 doi:10.1016/s0169-4332(98)00087-7 |
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Plain Text | Shen, A., Ohno, H., Horikoshi, Y., Guo, S.P., Ohno, Y., Matsukura, F. (1998) Low-temperature GaAs grown by molecular-beam epitaxy under high As overpressure: a reflection high-energy electron diffraction study. Applied Surface Science, 130. 382-386 doi:10.1016/s0169-4332(98)00087-7 |
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In | (n.d.) Applied Surface Science Vol. 130. Elsevier BV |
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