Sammelselg, V, Rosental, A, Tarre, A, Niinistö, L, Heiskanen, K, Ilmonen, K, Johansson, L.-S, Uustare, T (1998) TiO2 thin films by atomic layer deposition: a case of uneven growth at low temperature. Applied Surface Science, 134. 78-86 doi:10.1016/s0169-4332(98)00224-4
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | TiO2 thin films by atomic layer deposition: a case of uneven growth at low temperature | ||
Journal | Applied Surface Science | ||
Authors | Sammelselg, V | Author | |
Rosental, A | Author | ||
Tarre, A | Author | ||
Niinistö, L | Author | ||
Heiskanen, K | Author | ||
Ilmonen, K | Author | ||
Johansson, L.-S | Author | ||
Uustare, T | Author | ||
Year | 1998 (September) | Volume | 134 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0169-4332(98)00224-4Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9900546 | Long-form Identifier | mindat:1:5:9900546:5 |
GUID | 0 | ||
Full Reference | Sammelselg, V, Rosental, A, Tarre, A, Niinistö, L, Heiskanen, K, Ilmonen, K, Johansson, L.-S, Uustare, T (1998) TiO2 thin films by atomic layer deposition: a case of uneven growth at low temperature. Applied Surface Science, 134. 78-86 doi:10.1016/s0169-4332(98)00224-4 | ||
Plain Text | Sammelselg, V, Rosental, A, Tarre, A, Niinistö, L, Heiskanen, K, Ilmonen, K, Johansson, L.-S, Uustare, T (1998) TiO2 thin films by atomic layer deposition: a case of uneven growth at low temperature. Applied Surface Science, 134. 78-86 doi:10.1016/s0169-4332(98)00224-4 | ||
In | (n.d.) Applied Surface Science Vol. 134. Elsevier BV |
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