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Demanet, C.M (1998) Scanning force microscopy investigation of ion bombarded InP. Applied Surface Science, 135. 53-58 doi:10.1016/s0169-4332(98)00306-7

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Reference TypeJournal (article/letter/editorial)
TitleScanning force microscopy investigation of ion bombarded InP
JournalApplied Surface Science
AuthorsDemanet, C.MAuthor
Year1998 (September)Volume135
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00306-7Search in ResearchGate
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Mindat Ref. ID9900619Long-form Identifiermindat:1:5:9900619:0
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Full ReferenceDemanet, C.M (1998) Scanning force microscopy investigation of ion bombarded InP. Applied Surface Science, 135. 53-58 doi:10.1016/s0169-4332(98)00306-7
Plain TextDemanet, C.M (1998) Scanning force microscopy investigation of ion bombarded InP. Applied Surface Science, 135. 53-58 doi:10.1016/s0169-4332(98)00306-7
In(n.d.) Applied Surface Science Vol. 135. Elsevier BV

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Demanet, C. M., Vijaya Sankar, K., Malherbe, J. B. (1996) Atomic Force Microscopy Investigation of Ion-bombarded InP: Effect of Angle of Ion Bombardment. Surface and Interface Analysis, 24 (8). 503-510 doi:10.1002/(sici)1096-9918(199608)24:8<503::aid-sia144>3.0.co;2-z
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