Vouagner, D., Beleznai, Cs., Girardeau-Montaut, J.P. (1999) Characterization of the photoelectric effect on K+-implanted W samples. Applied Surface Science, 138. 517-521 doi:10.1016/s0169-4332(98)00492-9
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Characterization of the photoelectric effect on K+-implanted W samples | ||
Journal | Applied Surface Science | ||
Authors | Vouagner, D. | Author | |
Beleznai, Cs. | Author | ||
Girardeau-Montaut, J.P. | Author | ||
Year | 1999 (January) | Volume | 138 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0169-4332(98)00492-9Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9900797 | Long-form Identifier | mindat:1:5:9900797:7 |
GUID | 0 | ||
Full Reference | Vouagner, D., Beleznai, Cs., Girardeau-Montaut, J.P. (1999) Characterization of the photoelectric effect on K+-implanted W samples. Applied Surface Science, 138. 517-521 doi:10.1016/s0169-4332(98)00492-9 | ||
Plain Text | Vouagner, D., Beleznai, Cs., Girardeau-Montaut, J.P. (1999) Characterization of the photoelectric effect on K+-implanted W samples. Applied Surface Science, 138. 517-521 doi:10.1016/s0169-4332(98)00492-9 | ||
In | (n.d.) Applied Surface Science Vol. 138. Elsevier BV |
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