Yoshitake, Tsuyoshi, Nishiyama, Takashi, Aoki, Hajime, Suizu, Koji, Takahashi, Koji, Nagayama, Kunihito (1999) Atomic force microscope study of carbon thin films prepared by pulsed laser deposition. Applied Surface Science, 141. 129-137 doi:10.1016/s0169-4332(98)00601-1
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Atomic force microscope study of carbon thin films prepared by pulsed laser deposition | ||
Journal | Applied Surface Science | ||
Authors | Yoshitake, Tsuyoshi | Author | |
Nishiyama, Takashi | Author | ||
Aoki, Hajime | Author | ||
Suizu, Koji | Author | ||
Takahashi, Koji | Author | ||
Nagayama, Kunihito | Author | ||
Year | 1999 (March) | Volume | 141 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0169-4332(98)00601-1Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9900901 | Long-form Identifier | mindat:1:5:9900901:8 |
GUID | 0 | ||
Full Reference | Yoshitake, Tsuyoshi, Nishiyama, Takashi, Aoki, Hajime, Suizu, Koji, Takahashi, Koji, Nagayama, Kunihito (1999) Atomic force microscope study of carbon thin films prepared by pulsed laser deposition. Applied Surface Science, 141. 129-137 doi:10.1016/s0169-4332(98)00601-1 | ||
Plain Text | Yoshitake, Tsuyoshi, Nishiyama, Takashi, Aoki, Hajime, Suizu, Koji, Takahashi, Koji, Nagayama, Kunihito (1999) Atomic force microscope study of carbon thin films prepared by pulsed laser deposition. Applied Surface Science, 141. 129-137 doi:10.1016/s0169-4332(98)00601-1 | ||
In | (n.d.) Applied Surface Science Vol. 141. Elsevier BV |
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