Zhang, Jun-Ying, Boyd, Ian W (2002) Structural and electrical properties of tantalum oxide films grown by photo-assisted pulsed laser deposition. Applied Surface Science, 186. 40-44 doi:10.1016/s0169-4332(01)00752-8
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Structural and electrical properties of tantalum oxide films grown by photo-assisted pulsed laser deposition | ||
Journal | Applied Surface Science | ||
Authors | Zhang, Jun-Ying | Author | |
Boyd, Ian W | Author | ||
Year | 2002 (January) | Volume | 186 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0169-4332(01)00752-8Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9903516 | Long-form Identifier | mindat:1:5:9903516:5 |
GUID | 0 | ||
Full Reference | Zhang, Jun-Ying, Boyd, Ian W (2002) Structural and electrical properties of tantalum oxide films grown by photo-assisted pulsed laser deposition. Applied Surface Science, 186. 40-44 doi:10.1016/s0169-4332(01)00752-8 | ||
Plain Text | Zhang, Jun-Ying, Boyd, Ian W (2002) Structural and electrical properties of tantalum oxide films grown by photo-assisted pulsed laser deposition. Applied Surface Science, 186. 40-44 doi:10.1016/s0169-4332(01)00752-8 | ||
In | (n.d.) Applied Surface Science Vol. 186. Elsevier BV |
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