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Gruzza, B, Robert, C, Bideux, L (2003) EPES applied to the study of gold/alumina interfaces. Applied Surface Science, 212. 667-673 doi:10.1016/s0169-4332(03)00417-3

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Reference TypeJournal (article/letter/editorial)
TitleEPES applied to the study of gold/alumina interfaces
JournalApplied Surface Science
AuthorsGruzza, BAuthor
Robert, CAuthor
Bideux, LAuthor
Year2003 (May)Volume212
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(03)00417-3Search in ResearchGate
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Mindat Ref. ID9905149Long-form Identifiermindat:1:5:9905149:1
GUID0
Full ReferenceGruzza, B, Robert, C, Bideux, L (2003) EPES applied to the study of gold/alumina interfaces. Applied Surface Science, 212. 667-673 doi:10.1016/s0169-4332(03)00417-3
Plain TextGruzza, B, Robert, C, Bideux, L (2003) EPES applied to the study of gold/alumina interfaces. Applied Surface Science, 212. 667-673 doi:10.1016/s0169-4332(03)00417-3
In(n.d.) Applied Surface Science Vol. 212. Elsevier BV

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Petit, M., Ould-Metidji, Y., Robert, Ch., Bideux, L., Gruzza, B., Matolin, V. (2003) First stages of the InP(1 0 0) surfaces nitridation studied by AES, EELS and EPES. Applied Surface Science, 212. 601-606 doi:10.1016/s0169-4332(03)00399-4
Ould-Metidji, Y., Bideux, L., Baca, D., Gruzza, B., Matolin, V. (2003) Nitridation of GaAs(1 0 0) substrates and Ga/GaAs systems studied by XPS spectroscopy. Applied Surface Science, 212. 614-618 doi:10.1016/s0169-4332(03)00395-7
Robert, C., Bideux, L., Gruzza, B., Vazsonyi, E., Gergely, G. (1997) Elastic reflection of electrons by porous silicon layered (PSL) surfaces: effects of porosity. Applied Surface Science, 115. 111-115 doi:10.1016/s0169-4332(97)80192-4
(2003) Acknowledgements. Applied Surface Science, 212. 2pp. doi:10.1016/s0169-4332(03)00657-3
Gruzza, B, Merle, S, Bideux, L, Robert, C, Kover, L, Toth, J, Matolin, V (2001) UHV aluminium oxide on silicon substrates: electron spectroscopies analysis and electrical measurements. Applied Surface Science, 175. 656-662 doi:10.1016/s0169-4332(01)00119-2
(2003) Editorial Board. Applied Surface Science, 212. doi:10.1016/s0169-4332(03)00661-5
(2003) Author Index. Applied Surface Science, 212. doi:10.1016/s0169-4332(03)00668-8
(2003) Subject Index. Applied Surface Science, 212. doi:10.1016/s0169-4332(03)00669-x
(2003) In memoriam. Applied Surface Science, 212. 1pp. doi:10.1016/s0169-4332(03)00656-1
Bideux, L., Baca, D., Gruzza, B., Matolin, V., Robert-Goumet, C. (2004) Surface modification of GaAs during argon ionic cleaning and nitridation: EELS, EPES and XPS studies. Surface Science, 566. 1158-1162 doi:10.1016/j.susc.2004.06.076
Chelda, S., Robert-Goumet, C., Gruzza, B., Bideux, L., Monier, G. (2008) Effect of surface roughness on EPES and AREPES measurements: Flat and crenels silicon surfaces. Surface Science, 602 (12). 2114-2120 doi:10.1016/j.susc.2008.04.020
 
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