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Aoyama, T., Akimoto, K., Ichimiya, A., Hisada, Y., Mukainakano, S., Emoto, T., Tajiri, H., Takahashi, T., Sugiyama, H., Zhang, X., Kawata, H. (2003) Structural study of SiC(0 0 0 1)3×3 surface by surface X-ray diffraction. Applied Surface Science, 216. 356-360 doi:10.1016/s0169-4332(03)00431-8

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Reference TypeJournal (article/letter/editorial)
TitleStructural study of SiC(0 0 0 1)3×3 surface by surface X-ray diffraction
JournalApplied Surface Science
AuthorsAoyama, T.Author
Akimoto, K.Author
Ichimiya, A.Author
Hisada, Y.Author
Mukainakano, S.Author
Emoto, T.Author
Tajiri, H.Author
Takahashi, T.Author
Sugiyama, H.Author
Zhang, X.Author
Kawata, H.Author
Year2003 (June)Volume216
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(03)00431-8Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9905287Long-form Identifiermindat:1:5:9905287:0
GUID0
Full ReferenceAoyama, T., Akimoto, K., Ichimiya, A., Hisada, Y., Mukainakano, S., Emoto, T., Tajiri, H., Takahashi, T., Sugiyama, H., Zhang, X., Kawata, H. (2003) Structural study of SiC(0 0 0 1)3×3 surface by surface X-ray diffraction. Applied Surface Science, 216. 356-360 doi:10.1016/s0169-4332(03)00431-8
Plain TextAoyama, T., Akimoto, K., Ichimiya, A., Hisada, Y., Mukainakano, S., Emoto, T., Tajiri, H., Takahashi, T., Sugiyama, H., Zhang, X., Kawata, H. (2003) Structural study of SiC(0 0 0 1)3×3 surface by surface X-ray diffraction. Applied Surface Science, 216. 356-360 doi:10.1016/s0169-4332(03)00431-8
In(n.d.) Applied Surface Science Vol. 216. Elsevier BV

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