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Hirai, Masaaki, Labis, Joselito P., Ohi, Akihiko, Kamezawa, Chihiro, Morikawa, Yuhji, Yoshida, Kenichi, Kusaka, Masahiko, Iwami, Motohiro (2003) Nano-structure of transition-metal (Ti, Ni)/SiC system: photo-emission electron microscopy and soft X-ray fluorescence spectroscopy. Applied Surface Science, 216. 187-191 doi:10.1016/s0169-4332(03)00444-6

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Reference TypeJournal (article/letter/editorial)
TitleNano-structure of transition-metal (Ti, Ni)/SiC system: photo-emission electron microscopy and soft X-ray fluorescence spectroscopy
JournalApplied Surface Science
AuthorsHirai, MasaakiAuthor
Labis, Joselito P.Author
Ohi, AkihikoAuthor
Kamezawa, ChihiroAuthor
Morikawa, YuhjiAuthor
Yoshida, KenichiAuthor
Kusaka, MasahikoAuthor
Iwami, MotohiroAuthor
Year2003 (June)Volume216
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(03)00444-6Search in ResearchGate
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Mindat Ref. ID9905300Long-form Identifiermindat:1:5:9905300:0
GUID0
Full ReferenceHirai, Masaaki, Labis, Joselito P., Ohi, Akihiko, Kamezawa, Chihiro, Morikawa, Yuhji, Yoshida, Kenichi, Kusaka, Masahiko, Iwami, Motohiro (2003) Nano-structure of transition-metal (Ti, Ni)/SiC system: photo-emission electron microscopy and soft X-ray fluorescence spectroscopy. Applied Surface Science, 216. 187-191 doi:10.1016/s0169-4332(03)00444-6
Plain TextHirai, Masaaki, Labis, Joselito P., Ohi, Akihiko, Kamezawa, Chihiro, Morikawa, Yuhji, Yoshida, Kenichi, Kusaka, Masahiko, Iwami, Motohiro (2003) Nano-structure of transition-metal (Ti, Ni)/SiC system: photo-emission electron microscopy and soft X-ray fluorescence spectroscopy. Applied Surface Science, 216. 187-191 doi:10.1016/s0169-4332(03)00444-6
In(n.d.) Applied Surface Science Vol. 216. Elsevier BV

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Labis, Joselito, Ohi, Akihiko, Kamezawa, Chihiro, Yoshida, Kenichi, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro (2002) Surface and interface of Ti(film)/SiC(substrate) system: a soft X-ray emission and photoemission electron microscopy study. Applied Surface Science, 190. 521-526 doi:10.1016/s0169-4332(01)00931-x
LABIS, JOSELITO, OHI, AKIHIKO, KAMEZAWA, CHIHIRO, FUJIKI, TOSHINORI, YOSHIDA, KENICHI, HIRAI, MASAAKI, KUSAKA, MASAHIKO, IWAMI, MOTOHIRO (2002) PEEM AND SXES CHARACTERIZATION ON THE SURFACE AND INTERFACE OF THE TRANSITION-METAL/SiC SYSTEM. Surface Review and Letters, 9 (1). 313-318 doi:10.1142/s0218625x02002300
Labis, Joselito, Kamezawa, Chihiro, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro (2002) Photoemission Electron Imaging of Transition Metal (Ti, Ni) Surfaces on Si and SiC. Materials Science Forum, 389. 721-724 doi:10.4028/www.scientific.net/msf.389-393.721
Labis, Joselito, Ohi, Akihiko, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro (2003) Surface morphology and interface structural analyses of Ti(film)/SiC(substrate) by PEEM, SXES, AES and XRD. Surface and Interface Analysis, 35 (1). 89-93 doi:10.1002/sia.1500
Ohi, A., Labis, J., Morikawa, Y., Fujiki, T., Hirai, M., Kusaka, M., Iwami, M. (2002) Soft X-ray emission study of thermally treated Ni(film)/4H–SiC(substrate) interface. Applied Surface Science, 190. 366-370 doi:10.1016/s0169-4332(01)00860-1
Hirai, Masaaki, Kamezawa, Chihiro, Azatyan, S., An, Z., Shinagawa, T., Fujisawa, T., Kusaka, Masahiko, Iwami, Motohiro (2004) Interface Electronic Structures of Transition Metal(Cr, Fe) on 6H(4H)-SiC(0001)Si Face by Soft X-Ray Fluorescence Spectroscopy. Materials Science Forum, 457. 427-430 doi:10.4028/www.scientific.net/msf.457-460.427
Hattori, N., Hirai, M., Kusaka, M., Iwami, M. (2003) Investigation of SiC clean surface and Ni/SiC interface using scanning tunneling microscopy. Applied Surface Science, 216. 54-58 doi:10.1016/s0169-4332(03)00498-7
Labis, J, Ohi, A, Hirai, M, Kusaka, M, Iwami, M (2001) Interfacial reaction study of thermally annealed Ti film on 4H-SiC by soft X-ray emission spectroscopy. Surface Science, 493 (1). 447-452 doi:10.1016/s0039-6028(01)01252-3
Hirai, M., Kamezawa, C., Azatyan, S., An, Z., Shinagawa, T., Fujisawa, T., Kusaka, M., Iwami, M. (2005) Interface study of transition metal (Fe, Zr) on 4H–SiC(0001)Si face: photoemission electron microscopy and soft X-ray fluorescence spectroscopy. Applied Surface Science, 249. 362-366 doi:10.1016/j.apsusc.2004.12.010
An, Zhenlian, Kamezawa, Chihiro, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro (2002) Valence Band Density of States of Cu3Si Studied by Soft X-Ray Emission Spectroscopy and a First-Principle Molecular Orbital Calculation. Journal of the Physical Society of Japan, 71 (12). 2948-2952 doi:10.1143/jpsj.71.2948
An, Z., Hirai, M., Kusaka, M., Iwami, M. (2003) Surface and interface study of Cu (film)/SiC (substrate) system. Applied Surface Science, 216. 169-173 doi:10.1016/s0169-4332(03)00459-8
 
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