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Nishida, K., Sugino, T., Osada, M., Kakihana, M., Katoda, T. (2003) An orientation ratio and ferroelectric properties of ultra-thin PTO films. Applied Surface Science, 216. 312-317 doi:10.1016/s0169-4332(03)00446-x

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Reference TypeJournal (article/letter/editorial)
TitleAn orientation ratio and ferroelectric properties of ultra-thin PTO films
JournalApplied Surface Science
AuthorsNishida, K.Author
Sugino, T.Author
Osada, M.Author
Kakihana, M.Author
Katoda, T.Author
Year2003 (June)Volume216
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(03)00446-xSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID9905302Long-form Identifiermindat:1:5:9905302:8
GUID0
Full ReferenceNishida, K., Sugino, T., Osada, M., Kakihana, M., Katoda, T. (2003) An orientation ratio and ferroelectric properties of ultra-thin PTO films. Applied Surface Science, 216. 312-317 doi:10.1016/s0169-4332(03)00446-x
Plain TextNishida, K., Sugino, T., Osada, M., Kakihana, M., Katoda, T. (2003) An orientation ratio and ferroelectric properties of ultra-thin PTO films. Applied Surface Science, 216. 312-317 doi:10.1016/s0169-4332(03)00446-x
In(n.d.) Applied Surface Science Vol. 216. Elsevier BV

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(2003) Editorial Board. Applied Surface Science, 216. doi:10.1016/s0169-4332(03)00776-1
 
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