Teraoka, Yuden, Moritani, Kousuke, Yoshigoe, Akitaka (2003) Coexistence of passive and active oxidation for O2/Si(0 0 1) system observed by SiO mass spectrometry and synchrotron radiation photoemission spectroscopy. Applied Surface Science, 216. 8-14 doi:10.1016/s0169-4332(03)00479-3
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Coexistence of passive and active oxidation for O2/Si(0 0 1) system observed by SiO mass spectrometry and synchrotron radiation photoemission spectroscopy | ||
Journal | Applied Surface Science | ||
Authors | Teraoka, Yuden | Author | |
Moritani, Kousuke | Author | ||
Yoshigoe, Akitaka | Author | ||
Year | 2003 (June) | Volume | 216 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0169-4332(03)00479-3Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9905327 | Long-form Identifier | mindat:1:5:9905327:7 |
GUID | 0 | ||
Full Reference | Teraoka, Yuden, Moritani, Kousuke, Yoshigoe, Akitaka (2003) Coexistence of passive and active oxidation for O2/Si(0 0 1) system observed by SiO mass spectrometry and synchrotron radiation photoemission spectroscopy. Applied Surface Science, 216. 8-14 doi:10.1016/s0169-4332(03)00479-3 | ||
Plain Text | Teraoka, Yuden, Moritani, Kousuke, Yoshigoe, Akitaka (2003) Coexistence of passive and active oxidation for O2/Si(0 0 1) system observed by SiO mass spectrometry and synchrotron radiation photoemission spectroscopy. Applied Surface Science, 216. 8-14 doi:10.1016/s0169-4332(03)00479-3 | ||
In | (n.d.) Applied Surface Science Vol. 216. Elsevier BV |
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