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Wirtz, T., Migeon, H.-N. (2004) In situ deposition of neutral Cs for Secondary Ion Mass Spectrometry. Applied Surface Science, 222. 186-197 doi:10.1016/j.apsusc.2003.08.020

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Reference TypeJournal (article/letter/editorial)
TitleIn situ deposition of neutral Cs for Secondary Ion Mass Spectrometry
JournalApplied Surface Science
AuthorsWirtz, T.Author
Migeon, H.-N.Author
Year2004 (January)Volume222
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2003.08.020Search in ResearchGate
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Mindat Ref. ID9905638Long-form Identifiermindat:1:5:9905638:0
GUID0
Full ReferenceWirtz, T., Migeon, H.-N. (2004) In situ deposition of neutral Cs for Secondary Ion Mass Spectrometry. Applied Surface Science, 222. 186-197 doi:10.1016/j.apsusc.2003.08.020
Plain TextWirtz, T., Migeon, H.-N. (2004) In situ deposition of neutral Cs for Secondary Ion Mass Spectrometry. Applied Surface Science, 222. 186-197 doi:10.1016/j.apsusc.2003.08.020
In(n.d.) Applied Surface Science Vol. 222. Elsevier BV

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Wirtz, T., Migeon, H.-N. (2004) Optimization of SIMS analyses performed in the MCsx+ mode by using an in situ deposition of Cs. Applied Surface Science, 231. 743-748 doi:10.1016/j.apsusc.2004.03.044
Philipp, P., Wirtz, T., Migeon, H.-N., Scherrer, H. (2006) Important increase of negative secondary ion sensitivity during SIMS analysis by neutral cesium deposition. Applied Surface Science, 252. 7205-7207 doi:10.1016/j.apsusc.2006.02.119
Wirtz, T., Migeon, H.-N. (2004) Optimization of SIMS analyses performed in the MCsx+ mode by using an in situ deposition of neutral Cs. Surface Science, 557 (1). 57-72 doi:10.1016/j.susc.2004.03.015
Philipp, P., Wirtz, T., Migeon, H.-N., Scherrer, H. (2004) Cation Mass Spectrometer (CMS): recent developments for quantitative analyses of positive and negative secondary ions. Applied Surface Science, 231. 754-757 doi:10.1016/j.apsusc.2004.03.050
Philipp, P., Wirtz, T., Migeon, H.-N., Scherrer, H. (2006) SIMS analysis with neutral cesium deposition: Negative secondary ion sensitivity increase and quantification aspects. International Journal of Mass Spectrometry, 253 (1). 71-78 doi:10.1016/j.ijms.2006.02.018
Verdeil, C., Wirtz, T., Migeon, H.-N., Scherrer, H. (2008) Angular distribution of sputtered matter under Cs+ bombardment with oblique incidence. Applied Surface Science, 255. 870-873 doi:10.1016/j.apsusc.2008.05.231
Wirtz, T, Migeon, H.-N (2004) Development of a column delivering a collimated stream of Cs0 for SIMS purposes. Applied Surface Science, 231. 940-944 doi:10.1016/j.apsusc.2004.03.180
Philipp, P., Wirtz, T., Migeon, H.-N., Scherrer, H. (2007) Electron work function decrease in SIMS analysis induced by neutral cesium deposition. International Journal of Mass Spectrometry, 264 (1). 70-83 doi:10.1016/j.ijms.2007.03.019
Wirtz, T, Migeon, H.-N (2004) Work function shifts and variations of ionization probabilities occurring during SIMS analyses using an in situ deposition of Cs0. Surface Science, 561 (2). 200-207 doi:10.1016/j.susc.2004.05.068
Wirtz, T., Migeon, H.-N. (2008) Storing Matter: A new quantitative and sensitive analytical technique. Applied Surface Science, 255. 1498-1500 doi:10.1016/j.apsusc.2008.05.109
Wirtz, T, Migeon, H.-N, Scherrer, H (2003) Cation Mass Spectrometer: towards an optimisation of MCsx+ cluster analysis. Applied Surface Science, 203. 189-193 doi:10.1016/s0169-4332(02)00622-0
 
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