Reference Type | Journal (article/letter/editorial) |
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Title | SIMS analysis of ZnO films co-doped with N and Ga by temperature gradient pulsed laser deposition |
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Journal | Applied Surface Science |
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Authors | Sumiya, M. | Author |
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Tsukazaki, A. | Author |
Fuke, S. | Author |
Ohtomo, A. | Author |
Koinuma, H. | Author |
Kawasaki, M. | Author |
Year | 2004 (February) | Volume | 223 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0169-4332(03)00923-1Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9905708 | Long-form Identifier | mindat:1:5:9905708:8 |
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GUID | 0 |
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Full Reference | Sumiya, M., Tsukazaki, A., Fuke, S., Ohtomo, A., Koinuma, H., Kawasaki, M. (2004) SIMS analysis of ZnO films co-doped with N and Ga by temperature gradient pulsed laser deposition. Applied Surface Science, 223. 206-209 doi:10.1016/s0169-4332(03)00923-1 |
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Plain Text | Sumiya, M., Tsukazaki, A., Fuke, S., Ohtomo, A., Koinuma, H., Kawasaki, M. (2004) SIMS analysis of ZnO films co-doped with N and Ga by temperature gradient pulsed laser deposition. Applied Surface Science, 223. 206-209 doi:10.1016/s0169-4332(03)00923-1 |
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In | (n.d.) Applied Surface Science Vol. 223. Elsevier BV |
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