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Wei, Sufeng, Lian, Jianshe, Chen, Xuejiao, Jiang, Qing (2008) Effects of seed layer on the structure and property of zinc oxide thin films electrochemically deposited on ITO-coated glass. Applied Surface Science, 254. 6605-6610 doi:10.1016/j.apsusc.2008.04.039

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Reference TypeJournal (article/letter/editorial)
TitleEffects of seed layer on the structure and property of zinc oxide thin films electrochemically deposited on ITO-coated glass
JournalApplied Surface Science
AuthorsWei, SufengAuthor
Lian, JiansheAuthor
Chen, XuejiaoAuthor
Jiang, QingAuthor
Year2008 (August)Volume254
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2008.04.039Search in ResearchGate
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Mindat Ref. ID9911612Long-form Identifiermindat:1:5:9911612:3
GUID0
Full ReferenceWei, Sufeng, Lian, Jianshe, Chen, Xuejiao, Jiang, Qing (2008) Effects of seed layer on the structure and property of zinc oxide thin films electrochemically deposited on ITO-coated glass. Applied Surface Science, 254. 6605-6610 doi:10.1016/j.apsusc.2008.04.039
Plain TextWei, Sufeng, Lian, Jianshe, Chen, Xuejiao, Jiang, Qing (2008) Effects of seed layer on the structure and property of zinc oxide thin films electrochemically deposited on ITO-coated glass. Applied Surface Science, 254. 6605-6610 doi:10.1016/j.apsusc.2008.04.039
In(n.d.) Applied Surface Science Vol. 254. Elsevier BV

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