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Bae, Joon Woo, Lim, Jae-Won, Mimura, Kouji, Uchikoshi, Masahito, Miyazaki, Takamichi, Isshiki, Minoru (2010) Effect of UV lamp irradiation during oxidation of Zr/Pt/Si structure on electrical properties of Pt/ZrO2/Pt/Si structure. Applied Surface Science, 256. 3518-3521 doi:10.1016/j.apsusc.2009.12.101

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Reference TypeJournal (article/letter/editorial)
TitleEffect of UV lamp irradiation during oxidation of Zr/Pt/Si structure on electrical properties of Pt/ZrO2/Pt/Si structure
JournalApplied Surface Science
AuthorsBae, Joon WooAuthor
Lim, Jae-WonAuthor
Mimura, KoujiAuthor
Uchikoshi, MasahitoAuthor
Miyazaki, TakamichiAuthor
Isshiki, MinoruAuthor
Year2010 (March)Volume256
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2009.12.101Search in ResearchGate
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Mindat Ref. ID9914375Long-form Identifiermindat:1:5:9914375:6
GUID0
Full ReferenceBae, Joon Woo, Lim, Jae-Won, Mimura, Kouji, Uchikoshi, Masahito, Miyazaki, Takamichi, Isshiki, Minoru (2010) Effect of UV lamp irradiation during oxidation of Zr/Pt/Si structure on electrical properties of Pt/ZrO2/Pt/Si structure. Applied Surface Science, 256. 3518-3521 doi:10.1016/j.apsusc.2009.12.101
Plain TextBae, Joon Woo, Lim, Jae-Won, Mimura, Kouji, Uchikoshi, Masahito, Miyazaki, Takamichi, Isshiki, Minoru (2010) Effect of UV lamp irradiation during oxidation of Zr/Pt/Si structure on electrical properties of Pt/ZrO2/Pt/Si structure. Applied Surface Science, 256. 3518-3521 doi:10.1016/j.apsusc.2009.12.101
In(n.d.) Applied Surface Science Vol. 256. Elsevier BV

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Bae, Joon Woo, Lim, Jae-Won, Mimura, Kouji, Uchikoshi, Masahito, Wada, Mitsuhiro, Ikeda, Makoto, Isshiki, Minoru (2009) Influence of substrate bias voltage on properties of Pt thin films deposited by non-mass separated ion beam deposition method. Materials Letters, 63. 2181-2184 doi:10.1016/j.matlet.2009.07.015
Bae, Joon Woo, Lim, Jae-Won, Mimura, Kouji, Isshiki, Minoru (2004) Agglomeration of Copper Thin Film in Cu/Ta/Si Structure. MATERIALS TRANSACTIONS, 45 (3). 877-879 doi:10.2320/matertrans.45.877
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Fujita, Kensuke, Ando, Daisuke, Uchikoshi, Masahito, Mimura, Kouji, Isshiki, Minoru (2013) New model for low-temperature oxidation of copper single crystal. Applied Surface Science, 276. 347-358 doi:10.1016/j.apsusc.2013.03.096
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