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Sant, Tushar, Panzner, Tobias, Pietsch, Ullrich (2010) Capabilities of using white x-rays for the reconstruction of surface morphology from coherent reflectivity. Applied Surface Science, 257. 266-270 doi:10.1016/j.apsusc.2010.06.083

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Reference TypeJournal (article/letter/editorial)
TitleCapabilities of using white x-rays for the reconstruction of surface morphology from coherent reflectivity
JournalApplied Surface Science
AuthorsSant, TusharAuthor
Panzner, TobiasAuthor
Pietsch, UllrichAuthor
Year2010 (October)Volume257
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2010.06.083Search in ResearchGate
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Mindat Ref. ID9915663Long-form Identifiermindat:1:5:9915663:5
GUID0
Full ReferenceSant, Tushar, Panzner, Tobias, Pietsch, Ullrich (2010) Capabilities of using white x-rays for the reconstruction of surface morphology from coherent reflectivity. Applied Surface Science, 257. 266-270 doi:10.1016/j.apsusc.2010.06.083
Plain TextSant, Tushar, Panzner, Tobias, Pietsch, Ullrich (2010) Capabilities of using white x-rays for the reconstruction of surface morphology from coherent reflectivity. Applied Surface Science, 257. 266-270 doi:10.1016/j.apsusc.2010.06.083
In(n.d.) Applied Surface Science Vol. 257. Elsevier BV

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Pietsch, Ullrich, Panzner, Tobias, Leitenberger, Wolfram, Vartanyants, Ivan (2005) Coherence experiments using white synchrotron radiation. Physica B: Condensed Matter, 357 (1). 45-52 doi:10.1016/j.physb.2004.11.017
Pietsch, Ullrich, Panzner, Tobias, Pfeiffer, Franz, Robinson, Ian K. (2005) Substrate morphology repetition in “thick” polymer films. Physica B: Condensed Matter, 357 (1). 136-140 doi:10.1016/j.physb.2004.11.042
Xiao, Junfeng, Wang, Lei, Li, Xiaoqiang, Pi, Xiaodong, Yang, Deren (2010) Reflectivity of porous-pyramids structured silicon surface. Applied Surface Science, 257. 472-475 doi:10.1016/j.apsusc.2010.07.014
Ksenzov, Dmitriy, Panzner, Tobias, Schlemper, Christoph, Morawe, Christian, Pietsch, Ullrich (2009) Optical properties of boron carbide near the boron K edge evaluated by soft-x-ray reflectometry from a Ru/B_4C multilayer. Applied Optics, 48. 6684pp. doi:10.1364/ao.48.006684
Sokhey, K.J.S., Rai, S.K., Lodha, G.S. (2010) Oxidation studies of niobium thin films at room temperature by X-ray reflectivity. Applied Surface Science, 257. 222-226 doi:10.1016/j.apsusc.2010.06.069
Wang, X., Zhu, D.H., Shen, Z.H., Lu, J., Ni, X.W. (2010) Surface damage morphology investigations of silicon under millisecond laser irradiation. Applied Surface Science, 257. 1583-1588 doi:10.1016/j.apsusc.2010.08.098
Gupta, Pooja, Sinha, A.K., Modi, M.H., Gupta, S.M., Gupta, P.K., Deb, S.K. (2010) Resonant soft X-ray reflectivity as a sensitive probe to investigate polished zinc sulphide surface. Applied Surface Science, 257. 210-214 doi:10.1016/j.apsusc.2010.06.066
Vartanyants, I. A., Pitney, J. A., Libbert, J. L., Robinson, I. K. (1997) Reconstruction of surface morphology from coherent x-ray reflectivity. Physical Review B, 55 (19) 13193-13202 doi:10.1103/physrevb.55.13193
Robinson, I.K., Pitney, J.A., Libbert, J.L., Vartanyants, I.A. (1998) Surface morphology by reflectivity of coherent X-rays. Physica B: Condensed Matter, 248 (1). 387-394 doi:10.1016/s0921-4526(98)00357-3
Henneberg, Oliver, Panzner, Tobias, Pietsch, Ullrich, Geue, Thomas, Saphiannikova, Marina, Rochon, Paul, Finkelstein, Ken (2004) X-ray and VIS light scattering from light-induced polymer gratings. Zeitschrift für Kristallographie - Crystalline Materials, 219 (4) doi:10.1524/zkri.219.4.218.30438
Ksenzov, Dmitriy, Schlemper, Christoph, Pietsch, Ullrich (2010) Resonant soft x-ray reflectivity of Me/B_4C multilayers near the boron K edge. Applied Optics, 49. 4767pp. doi:10.1364/ao.49.004767
 
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