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Mageshwari, K., Sathyamoorthy, R., Sudhagar, P., Kang, Yong Soo (2011) Dielectric and relaxation properties of thermally evaporated nanostructured bismuth sulfide thin films. Applied Surface Science, 257. 7245-7253 doi:10.1016/j.apsusc.2011.03.100

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Reference TypeJournal (article/letter/editorial)
TitleDielectric and relaxation properties of thermally evaporated nanostructured bismuth sulfide thin films
JournalApplied Surface Science
AuthorsMageshwari, K.Author
Sathyamoorthy, R.Author
Sudhagar, P.Author
Kang, Yong SooAuthor
Year2011 (June)Volume257
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2011.03.100Search in ResearchGate
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Mindat Ref. ID9916143Long-form Identifiermindat:1:5:9916143:3
GUID0
Full ReferenceMageshwari, K., Sathyamoorthy, R., Sudhagar, P., Kang, Yong Soo (2011) Dielectric and relaxation properties of thermally evaporated nanostructured bismuth sulfide thin films. Applied Surface Science, 257. 7245-7253 doi:10.1016/j.apsusc.2011.03.100
Plain TextMageshwari, K., Sathyamoorthy, R., Sudhagar, P., Kang, Yong Soo (2011) Dielectric and relaxation properties of thermally evaporated nanostructured bismuth sulfide thin films. Applied Surface Science, 257. 7245-7253 doi:10.1016/j.apsusc.2011.03.100
In(n.d.) Applied Surface Science Vol. 257. Elsevier BV

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