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Chen, Bangdao, Liu, Hongzhong, Wang, Hongtao, Fan, Fan, Wang, Li, Ding, Yucheng, Lu, Bingheng (2011) Thermal shock induced nanocrack as high efficiency surface conduction electron emitter. Applied Surface Science, 257. 9125-9128 doi:10.1016/j.apsusc.2011.05.111

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Reference TypeJournal (article/letter/editorial)
TitleThermal shock induced nanocrack as high efficiency surface conduction electron emitter
JournalApplied Surface Science
AuthorsChen, BangdaoAuthor
Liu, HongzhongAuthor
Wang, HongtaoAuthor
Fan, FanAuthor
Wang, LiAuthor
Ding, YuchengAuthor
Lu, BinghengAuthor
Year2011 (August)Volume257
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2011.05.111Search in ResearchGate
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Mindat Ref. ID9916503Long-form Identifiermindat:1:5:9916503:1
GUID0
Full ReferenceChen, Bangdao, Liu, Hongzhong, Wang, Hongtao, Fan, Fan, Wang, Li, Ding, Yucheng, Lu, Bingheng (2011) Thermal shock induced nanocrack as high efficiency surface conduction electron emitter. Applied Surface Science, 257. 9125-9128 doi:10.1016/j.apsusc.2011.05.111
Plain TextChen, Bangdao, Liu, Hongzhong, Wang, Hongtao, Fan, Fan, Wang, Li, Ding, Yucheng, Lu, Bingheng (2011) Thermal shock induced nanocrack as high efficiency surface conduction electron emitter. Applied Surface Science, 257. 9125-9128 doi:10.1016/j.apsusc.2011.05.111
In(n.d.) Applied Surface Science Vol. 257. Elsevier BV

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