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Oyoshi, K., Nigo, S., Inoue, J., Sakai, O., Kitazawa, H., Kido, G. (2010) Formation and disruption of current paths of anodic porous alumina films by conducting atomic force microscopy. Applied Surface Science, 257. 837-841 doi:10.1016/j.apsusc.2010.07.076

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Reference TypeJournal (article/letter/editorial)
TitleFormation and disruption of current paths of anodic porous alumina films by conducting atomic force microscopy
JournalApplied Surface Science
AuthorsOyoshi, K.Author
Nigo, S.Author
Inoue, J.Author
Sakai, O.Author
Kitazawa, H.Author
Kido, G.Author
Year2010 (November)Volume257
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2010.07.076Search in ResearchGate
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Mindat Ref. ID9916820Long-form Identifiermindat:1:5:9916820:5
GUID0
Full ReferenceOyoshi, K., Nigo, S., Inoue, J., Sakai, O., Kitazawa, H., Kido, G. (2010) Formation and disruption of current paths of anodic porous alumina films by conducting atomic force microscopy. Applied Surface Science, 257. 837-841 doi:10.1016/j.apsusc.2010.07.076
Plain TextOyoshi, K., Nigo, S., Inoue, J., Sakai, O., Kitazawa, H., Kido, G. (2010) Formation and disruption of current paths of anodic porous alumina films by conducting atomic force microscopy. Applied Surface Science, 257. 837-841 doi:10.1016/j.apsusc.2010.07.076
In(n.d.) Applied Surface Science Vol. 257. Elsevier BV

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