Yang, Fei, Xu, Ling, Zhang, Rui, Geng, Lei, Tong, Liang, Xu, Jun, Su, Weining, Yu, Yao, Ma, Zhongyuan, Chen, Kunji (2012) Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope. Applied Surface Science, 258. 9751-9755 doi:10.1016/j.apsusc.2012.06.025
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope | ||
Journal | Applied Surface Science | ||
Authors | Yang, Fei | Author | |
Xu, Ling | Author | ||
Zhang, Rui | Author | ||
Geng, Lei | Author | ||
Tong, Liang | Author | ||
Xu, Jun | Author | ||
Su, Weining | Author | ||
Yu, Yao | Author | ||
Ma, Zhongyuan | Author | ||
Chen, Kunji | Author | ||
Year | 2012 (October) | Volume | 258 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.apsusc.2012.06.025Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9918499 | Long-form Identifier | mindat:1:5:9918499:3 |
GUID | 0 | ||
Full Reference | Yang, Fei, Xu, Ling, Zhang, Rui, Geng, Lei, Tong, Liang, Xu, Jun, Su, Weining, Yu, Yao, Ma, Zhongyuan, Chen, Kunji (2012) Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope. Applied Surface Science, 258. 9751-9755 doi:10.1016/j.apsusc.2012.06.025 | ||
Plain Text | Yang, Fei, Xu, Ling, Zhang, Rui, Geng, Lei, Tong, Liang, Xu, Jun, Su, Weining, Yu, Yao, Ma, Zhongyuan, Chen, Kunji (2012) Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope. Applied Surface Science, 258. 9751-9755 doi:10.1016/j.apsusc.2012.06.025 | ||
In | (n.d.) Applied Surface Science Vol. 258. Elsevier BV |
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