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Nedelcu, L., Scarisoreanu, N.D., Chirila, C., Busuioc, C., Banciu, M.G., Jinga, S.I., Dinescu, M. (2013) Structural and dielectric properties of Ba(X1/3Ta2/3)O3 thin films grown by RF-PLD. Applied Surface Science, 278. 158-161 doi:10.1016/j.apsusc.2012.10.124

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Reference TypeJournal (article/letter/editorial)
TitleStructural and dielectric properties of Ba(X1/3Ta2/3)O3 thin films grown by RF-PLD
JournalApplied Surface Science
AuthorsNedelcu, L.Author
Scarisoreanu, N.D.Author
Chirila, C.Author
Busuioc, C.Author
Banciu, M.G.Author
Jinga, S.I.Author
Dinescu, M.Author
Year2013 (August)Volume278
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2012.10.124Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9920777Long-form Identifiermindat:1:5:9920777:1
GUID0
Full ReferenceNedelcu, L., Scarisoreanu, N.D., Chirila, C., Busuioc, C., Banciu, M.G., Jinga, S.I., Dinescu, M. (2013) Structural and dielectric properties of Ba(X1/3Ta2/3)O3 thin films grown by RF-PLD. Applied Surface Science, 278. 158-161 doi:10.1016/j.apsusc.2012.10.124
Plain TextNedelcu, L., Scarisoreanu, N.D., Chirila, C., Busuioc, C., Banciu, M.G., Jinga, S.I., Dinescu, M. (2013) Structural and dielectric properties of Ba(X1/3Ta2/3)O3 thin films grown by RF-PLD. Applied Surface Science, 278. 158-161 doi:10.1016/j.apsusc.2012.10.124
In(n.d.) Applied Surface Science Vol. 278. Elsevier BV

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