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Gordillo, G., Calderón, C., Bartolo-Pérez, P. (2014) XPS analysis and structural and morphological characterization of Cu2ZnSnS4 thin films grown by sequential evaporation. Applied Surface Science, 305. 506-514 doi:10.1016/j.apsusc.2014.03.124

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Reference TypeJournal (article/letter/editorial)
TitleXPS analysis and structural and morphological characterization of Cu2ZnSnS4 thin films grown by sequential evaporation
JournalApplied Surface Science
AuthorsGordillo, G.Author
Calderón, C.Author
Bartolo-Pérez, P.Author
Year2014 (June)Volume305
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2014.03.124Search in ResearchGate
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Mindat Ref. ID9922837Long-form Identifiermindat:1:5:9922837:6
GUID0
Full ReferenceGordillo, G., Calderón, C., Bartolo-Pérez, P. (2014) XPS analysis and structural and morphological characterization of Cu2ZnSnS4 thin films grown by sequential evaporation. Applied Surface Science, 305. 506-514 doi:10.1016/j.apsusc.2014.03.124
Plain TextGordillo, G., Calderón, C., Bartolo-Pérez, P. (2014) XPS analysis and structural and morphological characterization of Cu2ZnSnS4 thin films grown by sequential evaporation. Applied Surface Science, 305. 506-514 doi:10.1016/j.apsusc.2014.03.124
In(n.d.) Applied Surface Science Vol. 305. Elsevier BV

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