Reference Type | Journal (article/letter/editorial) |
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Title | The investigation of the C–Si interface structure in diamond/Si nano-composite films with first principle method |
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Journal | Applied Surface Science |
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Authors | Liu, Xuejie | Author |
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Yin, Yongjie | Author |
Ren, Yuan | Author |
Wei, Huai | Author |
Year | 2014 (December) | Volume | 321 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/j.apsusc.2014.10.010Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9924234 | Long-form Identifier | mindat:1:5:9924234:9 |
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GUID | 0 |
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Full Reference | Liu, Xuejie, Yin, Yongjie, Ren, Yuan, Wei, Huai (2014) The investigation of the C–Si interface structure in diamond/Si nano-composite films with first principle method. Applied Surface Science, 321. 245-251 doi:10.1016/j.apsusc.2014.10.010 |
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Plain Text | Liu, Xuejie, Yin, Yongjie, Ren, Yuan, Wei, Huai (2014) The investigation of the C–Si interface structure in diamond/Si nano-composite films with first principle method. Applied Surface Science, 321. 245-251 doi:10.1016/j.apsusc.2014.10.010 |
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In | (n.d.) Applied Surface Science Vol. 321. Elsevier BV |
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