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Lin, Chenfang, Tong, Nai, Yang, Weisheng, Zhao, Ruguang, Hu, Zonghai (2015) Low energy electron diffraction study of high index copper surfaces underneath graphene. Applied Surface Science, 347. 147-154 doi:10.1016/j.apsusc.2015.03.147

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Reference TypeJournal (article/letter/editorial)
TitleLow energy electron diffraction study of high index copper surfaces underneath graphene
JournalApplied Surface Science
AuthorsLin, ChenfangAuthor
Tong, NaiAuthor
Yang, WeishengAuthor
Zhao, RuguangAuthor
Hu, ZonghaiAuthor
Year2015 (August)Volume347
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2015.03.147Search in ResearchGate
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Mindat Ref. ID9925524Long-form Identifiermindat:1:5:9925524:6
GUID0
Full ReferenceLin, Chenfang, Tong, Nai, Yang, Weisheng, Zhao, Ruguang, Hu, Zonghai (2015) Low energy electron diffraction study of high index copper surfaces underneath graphene. Applied Surface Science, 347. 147-154 doi:10.1016/j.apsusc.2015.03.147
Plain TextLin, Chenfang, Tong, Nai, Yang, Weisheng, Zhao, Ruguang, Hu, Zonghai (2015) Low energy electron diffraction study of high index copper surfaces underneath graphene. Applied Surface Science, 347. 147-154 doi:10.1016/j.apsusc.2015.03.147
In(n.d.) Applied Surface Science Vol. 347. Elsevier BV

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