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Park, Seonuk, Jeong, Yong Jin, Baek, Yonghwa, Kim, Lae Ho, Jang, Jin Hyuk, Kim, Yebyeol, An, Tae Kyu, Nam, Sooji, Kim, Se Hyun, Jang, Jaeyoung, Park, Chan Eon (2017) Reduced water vapor transmission rates of low-temperature solution-processed metal oxide barrier films via ultraviolet annealing. Applied Surface Science, 414. 262-269 doi:10.1016/j.apsusc.2017.04.100

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Reference TypeJournal (article/letter/editorial)
TitleReduced water vapor transmission rates of low-temperature solution-processed metal oxide barrier films via ultraviolet annealing
JournalApplied Surface Science
AuthorsPark, SeonukAuthor
Jeong, Yong JinAuthor
Baek, YonghwaAuthor
Kim, Lae HoAuthor
Jang, Jin HyukAuthor
Kim, YebyeolAuthor
An, Tae KyuAuthor
Nam, SoojiAuthor
Kim, Se HyunAuthor
Jang, JaeyoungAuthor
Park, Chan EonAuthor
Year2017 (August)Volume414
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2017.04.100Search in ResearchGate
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Mindat Ref. ID9931012Long-form Identifiermindat:1:5:9931012:7
GUID0
Full ReferencePark, Seonuk, Jeong, Yong Jin, Baek, Yonghwa, Kim, Lae Ho, Jang, Jin Hyuk, Kim, Yebyeol, An, Tae Kyu, Nam, Sooji, Kim, Se Hyun, Jang, Jaeyoung, Park, Chan Eon (2017) Reduced water vapor transmission rates of low-temperature solution-processed metal oxide barrier films via ultraviolet annealing. Applied Surface Science, 414. 262-269 doi:10.1016/j.apsusc.2017.04.100
Plain TextPark, Seonuk, Jeong, Yong Jin, Baek, Yonghwa, Kim, Lae Ho, Jang, Jin Hyuk, Kim, Yebyeol, An, Tae Kyu, Nam, Sooji, Kim, Se Hyun, Jang, Jaeyoung, Park, Chan Eon (2017) Reduced water vapor transmission rates of low-temperature solution-processed metal oxide barrier films via ultraviolet annealing. Applied Surface Science, 414. 262-269 doi:10.1016/j.apsusc.2017.04.100
In(n.d.) Applied Surface Science Vol. 414. Elsevier BV

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