Lee, Byung Chul, Kim, Chul Min, Jang, Ho–Kyun, Lee, Jae Woo, Joo, Min-Kyu, Kim, Gyu-Tae (2017) Degradation pattern of black phosphorus multilayer field−effect transistors in ambient conditions: Strategy for contact resistance engineering in BP transistors. Applied Surface Science, 419. 637-641 doi:10.1016/j.apsusc.2017.04.126
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Degradation pattern of black phosphorus multilayer field−effect transistors in ambient conditions: Strategy for contact resistance engineering in BP transistors | ||
| Journal | Applied Surface Science | ||
| Authors | Lee, Byung Chul | Author | |
| Kim, Chul Min | Author | ||
| Jang, Ho–Kyun | Author | ||
| Lee, Jae Woo | Author | ||
| Joo, Min-Kyu | Author | ||
| Kim, Gyu-Tae | Author | ||
| Year | 2017 (October) | Volume | 419 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.apsusc.2017.04.126Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9931317 | Long-form Identifier | mindat:1:5:9931317:9 |
| GUID | 0 | ||
| Full Reference | Lee, Byung Chul, Kim, Chul Min, Jang, Ho–Kyun, Lee, Jae Woo, Joo, Min-Kyu, Kim, Gyu-Tae (2017) Degradation pattern of black phosphorus multilayer field−effect transistors in ambient conditions: Strategy for contact resistance engineering in BP transistors. Applied Surface Science, 419. 637-641 doi:10.1016/j.apsusc.2017.04.126 | ||
| Plain Text | Lee, Byung Chul, Kim, Chul Min, Jang, Ho–Kyun, Lee, Jae Woo, Joo, Min-Kyu, Kim, Gyu-Tae (2017) Degradation pattern of black phosphorus multilayer field−effect transistors in ambient conditions: Strategy for contact resistance engineering in BP transistors. Applied Surface Science, 419. 637-641 doi:10.1016/j.apsusc.2017.04.126 | ||
| In | (n.d.) Applied Surface Science Vol. 419. Elsevier BV | ||
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