Ohlídal, Ivan, Vohánka, Jiří, Čermák, Martin, Franta, Daniel (2017) Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory. Applied Surface Science, 419. 942-956 doi:10.1016/j.apsusc.2017.04.211
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory | ||
| Journal | Applied Surface Science | ||
| Authors | Ohlídal, Ivan | Author | |
| Vohánka, Jiří | Author | ||
| Čermák, Martin | Author | ||
| Franta, Daniel | Author | ||
| Year | 2017 (October) | Volume | 419 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.apsusc.2017.04.211Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9931327 | Long-form Identifier | mindat:1:5:9931327:6 |
| GUID | 0 | ||
| Full Reference | Ohlídal, Ivan, Vohánka, Jiří, Čermák, Martin, Franta, Daniel (2017) Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory. Applied Surface Science, 419. 942-956 doi:10.1016/j.apsusc.2017.04.211 | ||
| Plain Text | Ohlídal, Ivan, Vohánka, Jiří, Čermák, Martin, Franta, Daniel (2017) Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory. Applied Surface Science, 419. 942-956 doi:10.1016/j.apsusc.2017.04.211 | ||
| In | (n.d.) Applied Surface Science Vol. 419. Elsevier BV | ||
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