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Holt, D. B. (1969) A study of defects in epitaxial films of ZnTe by transmission electron microscopy. Journal of Materials Science, 4. 935-943 doi:10.1007/bf00555307

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Reference TypeJournal (article/letter/editorial)
TitleA study of defects in epitaxial films of ZnTe by transmission electron microscopy
JournalJournal of Materials Science
AuthorsHolt, D. B.Author
Year1969 (November)Volume4
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00555307Search in ResearchGate
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Mindat Ref. ID9980935Long-form Identifiermindat:1:5:9980935:7
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Full ReferenceHolt, D. B. (1969) A study of defects in epitaxial films of ZnTe by transmission electron microscopy. Journal of Materials Science, 4. 935-943 doi:10.1007/bf00555307
Plain TextHolt, D. B. (1969) A study of defects in epitaxial films of ZnTe by transmission electron microscopy. Journal of Materials Science, 4. 935-943 doi:10.1007/bf00555307
In(n.d.) Journal of Materials Science Vol. 4. Springer Science and Business Media LLC

See Also

These are possibly similar items as determined by title/reference text matching only.

Holt, D. B. (1966) Defects in epitaxial films of semiconducting compounds with the sphalerite structure. Journal of Materials Science, 1. 280-295 doi:10.1007/bf00550176
Mufti, A. R., Holt, D. B. (1972) Epitaxial growth and structure of ZnTe evaporated on to Ge in vacuum. Journal of Materials Science, 7. 694-700 doi:10.1007/bf00549382
Wilcox, D. M., Holt, D. B. (1969) Epitaxial growth of CdS on ionic substrates. Journal of Materials Science, 4. 672-680 doi:10.1007/bf00742422
Sakai, Akira, Sunakawa, Haruo, Usui, Akira (1998) Transmission electron microscopy of defects in GaN films formed by epitaxial lateral overgrowth. Applied Physics Letters, 73 (4). 481-483 doi:10.1063/1.121907
Ahearn, J. S., Laird, C. (1977) Transmission electron microscopy observations of misfit dislocations in GaAsP epitaxial films. Journal of Materials Science, 12. 699-707 doi:10.1007/bf00548160
Rainey, P. E., Holt, D. L. (1971) An observation by transmission electron microscopy of diffusional creep in a magnesium alloy. Metallurgical and Materials Transactions B, 2 (11). 3238-3239 doi:10.1007/bf02814986
Litvinov, D., Gerthsen, D., Daniel, B., Klingshirn, C., Hetterich, M. (2006) Defects and phase distribution in epitaxial ZnMnSe layers analyzed by transmission electron microscopy. Journal of Applied Physics, 100 (2). 23523pp. doi:10.1063/1.2218493
Chase, B. D., Holt, D. B. (1972) Transmission electron microscope observations on GaP electroluminescent diode materials. Journal of Materials Science, 7. 265-278 doi:10.1007/bf00555627
Barlow, I. C. (1969) Transmission electron microscopy of a superplastic alloy, Al-78 wt % Zn. Journal of Materials Science, 4. 835-837 doi:10.1007/bf00551080
Holt, D. B., Woodcock, J. M. (1970) The structure of epitaxial films of ZnS evaporated onto NaCl in a vacuum. Journal of Materials Science, 5. 275-282 doi:10.1007/bf02397778
Y.Huang, J., Park, B. H., Jan, David, Pan, X. Q., Zhu, Yuntian T., Jia, Q. X. (2002) High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3. Philosophical Magazine A, 82 (4). 735-749 doi:10.1080/01418610110087291
 
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