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Laine, E., Lähteenmäki, I. (1980) The energy dispersive X-ray diffraction method: annotated bibliography 1968–78. Journal of Materials Science, 15. 269-277 doi:10.1007/bf02396775

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Reference TypeJournal (article/letter/editorial)
TitleThe energy dispersive X-ray diffraction method: annotated bibliography 1968–78
JournalJournal of Materials Science
AuthorsLaine, E.Author
Lähteenmäki, I.Author
Year1980 (February)Volume15
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf02396775Search in ResearchGate
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Mindat Ref. ID9984367Long-form Identifiermindat:1:5:9984367:0
GUID0
Full ReferenceLaine, E., Lähteenmäki, I. (1980) The energy dispersive X-ray diffraction method: annotated bibliography 1968–78. Journal of Materials Science, 15. 269-277 doi:10.1007/bf02396775
Plain TextLaine, E., Lähteenmäki, I. (1980) The energy dispersive X-ray diffraction method: annotated bibliography 1968–78. Journal of Materials Science, 15. 269-277 doi:10.1007/bf02396775
In(n.d.) Journal of Materials Science Vol. 15. Springer Science and Business Media LLC

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Laine, E., L�hteenm�ki, I., Lehtoranta, I. (1978) An X-ray study of splat-quenched Sn-Bi and Cu-Sb alloys by energy-dispersive diffraction. Journal of Materials Science, 13. 108-112 doi:10.1007/bf00739280
Laine, E.S.U., Lähteenmäki, I.T. (1983) Order-disorder transformation study in 25–35 AT.% Cd-Mg alloys by energy dispersive X-ray diffraction (EDXD). Materials Letters, 1. 166-170 doi:10.1016/0167-577x(83)90009-5
Szpunar, J., Gerward, L. (1980) Energy-dispersive X-ray diffraction studies of the texture in cold-rolled alpha-beta brass. Journal of Materials Science, 15. 469-476 doi:10.1007/bf02396797
Laine, E., Lähteenmäki, I., Kantola, M. (1972) Adaptation of solid state detector in X-Ray powder diffractometry. X-Ray Spectrometry, 1 (3). 93-98 doi:10.1002/xrs.1300010304
Tarna, T, Laine, E (1981) Energy Dispersive X-ray Diffraction Study of the Debye-Waller Factor of Nickel. Physica Scripta, 24 (6). 961-964 doi:10.1088/0031-8949/24/6/010
Egami, T. (1978) Structural relaxation in amorphous Fe40Ni40P14 B6 studied by energy dispersive X-ray diffraction. Journal of Materials Science, 13. 2587-2599 doi:10.1007/bf02402745
Laine, E, Lahteenmaki, I, Hamalainen, I (1974) Si(Li) semiconductor detector in angle and energy dispersive X-ray diffractometry. Journal of Physics E: Scientific Instruments, 7 (11). 951-954 doi:10.1088/0022-3735/7/11/026
Wilcox, Ray E., Izett, Glen A. (1968) Optic angle determined conoscopically on the spindle stage: I. Micrometer ocular method. American Mineralogist, 53 (1-2) 269-277
Laine, E., Tamminen, M., M�kel�, R., Pessa, M. (1983) An X-ray diffraction and electron spectroscopic study of metallic glass In20Te80. Journal of Materials Science, 18. 295-298 doi:10.1007/bf00543838
Zangvil, A., Gauchkler, L. J., R�hle, M. (1980) Indexed X-ray diffraction data for the sialon X-phase. Journal of Materials Science, 15. 788-790 doi:10.1007/bf00551748
Petkov, V. (1994) Energy-Dispersive X-Ray Diffraction Analysis of the Structure of Disordered Materials. Materials Science Forum, 166. 175-180 doi:10.4028/www.scientific.net/msf.166-169.175
 
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