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Hoel, R. H., Dingley, D. J. (1982) X-ray and electron microscopy studies of polysulphur nitride. Journal of Materials Science, 17. 2997-3008 doi:10.1007/bf00644681

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Reference TypeJournal (article/letter/editorial)
TitleX-ray and electron microscopy studies of polysulphur nitride
JournalJournal of Materials Science
AuthorsHoel, R. H.Author
Dingley, D. J.Author
Year1982 (October)Volume17
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00644681Search in ResearchGate
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Mindat Ref. ID9985298Long-form Identifiermindat:1:5:9985298:8
GUID0
Full ReferenceHoel, R. H., Dingley, D. J. (1982) X-ray and electron microscopy studies of polysulphur nitride. Journal of Materials Science, 17. 2997-3008 doi:10.1007/bf00644681
Plain TextHoel, R. H., Dingley, D. J. (1982) X-ray and electron microscopy studies of polysulphur nitride. Journal of Materials Science, 17. 2997-3008 doi:10.1007/bf00644681
In(n.d.) Journal of Materials Science Vol. 17. Springer Science and Business Media LLC

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Hoel, R. H., Dingley, D. J. (1982) Precision tensile testing of small specimens of polysulphur nitride in the scanning electron microscope. Journal of Materials Science, 17. 2990-2996 doi:10.1007/bf00644680
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Bhattacharyya, T. J., Kadaba, P. K. (1983) Dielectric constant and loss of polysulphur nitride in the microwave region. Journal of Materials Science Letters, 2 (12) 727-728 doi:10.1007/bf00720543
Birosca, S., Dingley, D., Higginson, R. L. (2004) Microstructural and microtextural characterization of oxide scale on steel using electron backscatter diffraction. Journal of Microscopy, 213 (3). 235-240 doi:10.1111/j.0022-2720.2004.01320.x
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