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Choi, Cheol, Kim, Hyun Jin, Lee, Yong-Tai, Kim, Young-Won, Lee, Chong Soo (2002) Effects of microstructural parameters on the fatigue crack growth of fully lamellar γ-TiAl alloys. Materials Science and Engineering: A, 329. 545-556 doi:10.1016/s0921-5093(01)01560-x

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Reference TypeJournal (article/letter/editorial)
TitleEffects of microstructural parameters on the fatigue crack growth of fully lamellar γ-TiAl alloys
JournalMaterials Science and Engineering: A
AuthorsChoi, CheolAuthor
Kim, Hyun JinAuthor
Lee, Yong-TaiAuthor
Kim, Young-WonAuthor
Lee, Chong SooAuthor
Year2002 (June)Volume329
PublisherElsevier BV
DOIdoi:10.1016/s0921-5093(01)01560-xSearch in ResearchGate
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Mindat Ref. ID10029180Long-form Identifiermindat:1:5:10029180:7
GUID0
Full ReferenceChoi, Cheol, Kim, Hyun Jin, Lee, Yong-Tai, Kim, Young-Won, Lee, Chong Soo (2002) Effects of microstructural parameters on the fatigue crack growth of fully lamellar γ-TiAl alloys. Materials Science and Engineering: A, 329. 545-556 doi:10.1016/s0921-5093(01)01560-x
Plain TextChoi, Cheol, Kim, Hyun Jin, Lee, Yong-Tai, Kim, Young-Won, Lee, Chong Soo (2002) Effects of microstructural parameters on the fatigue crack growth of fully lamellar γ-TiAl alloys. Materials Science and Engineering: A, 329. 545-556 doi:10.1016/s0921-5093(01)01560-x
In(n.d.) Materials Science and Engineering: A Vol. 329. Elsevier BV


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