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Chatterjee, A., Mecking, H., Arzt, E., Clemens, H. (2002) Creep behavior of γ-TiAl sheet material with differently spaced fully lamellar microstructures. Materials Science and Engineering: A, 329. 840-846 doi:10.1016/s0921-5093(01)01639-2

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Reference TypeJournal (article/letter/editorial)
TitleCreep behavior of γ-TiAl sheet material with differently spaced fully lamellar microstructures
JournalMaterials Science and Engineering: A
AuthorsChatterjee, A.Author
Mecking, H.Author
Arzt, E.Author
Clemens, H.Author
Year2002 (June)Volume329
PublisherElsevier BV
DOIdoi:10.1016/s0921-5093(01)01639-2Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10029259Long-form Identifiermindat:1:5:10029259:0
GUID0
Full ReferenceChatterjee, A., Mecking, H., Arzt, E., Clemens, H. (2002) Creep behavior of γ-TiAl sheet material with differently spaced fully lamellar microstructures. Materials Science and Engineering: A, 329. 840-846 doi:10.1016/s0921-5093(01)01639-2
Plain TextChatterjee, A., Mecking, H., Arzt, E., Clemens, H. (2002) Creep behavior of γ-TiAl sheet material with differently spaced fully lamellar microstructures. Materials Science and Engineering: A, 329. 840-846 doi:10.1016/s0921-5093(01)01639-2
In(n.d.) Materials Science and Engineering: A Vol. 329. Elsevier BV

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Beschliesser, M, Chatterjee, A, Lorich, A, Knabl, W, Kestler, H, Dehm, G, Clemens, H (2002) Designed fully lamellar microstructures in a γ-TiAl based alloy: adjustment and microstructural changes upon long-term isothermal exposure at 700 and 800°C. Materials Science and Engineering: A, 329. 124-129 doi:10.1016/s0921-5093(01)01545-3
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