Vote for your favorite mineral in #MinCup25! - Titanite vs. Thortveitite
It's a pair of T-minerals with as versatile #titanite faces off against the home of rare earth elements #thortveitite.
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Fu, Yongqing, Du, Hejun, Zhang, Sam, Huang, Weimin (2005) XPS characterization of surface and interfacial structure of sputtered TiNi films on Si substrate. Materials Science and Engineering: A, 403. 25-31 doi:10.1016/j.msea.2005.04.036

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleXPS characterization of surface and interfacial structure of sputtered TiNi films on Si substrate
JournalMaterials Science and Engineering: A
AuthorsFu, YongqingAuthor
Du, HejunAuthor
Zhang, SamAuthor
Huang, WeiminAuthor
Year2005 (August)Volume403
PublisherElsevier BV
DOIdoi:10.1016/j.msea.2005.04.036Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10032989Long-form Identifiermindat:1:5:10032989:0
GUID0
Full ReferenceFu, Yongqing, Du, Hejun, Zhang, Sam, Huang, Weimin (2005) XPS characterization of surface and interfacial structure of sputtered TiNi films on Si substrate. Materials Science and Engineering: A, 403. 25-31 doi:10.1016/j.msea.2005.04.036
Plain TextFu, Yongqing, Du, Hejun, Zhang, Sam, Huang, Weimin (2005) XPS characterization of surface and interfacial structure of sputtered TiNi films on Si substrate. Materials Science and Engineering: A, 403. 25-31 doi:10.1016/j.msea.2005.04.036
In(n.d.) Materials Science and Engineering: A Vol. 403. Elsevier BV

See Also

These are possibly similar items as determined by title/reference text matching only.

Fu, Yongqing, Du, Hejun, Zhang, Sam (2003) Functionally graded TiN/TiNi shape memory alloy films. Materials Letters, 57. 2995-2999 doi:10.1016/s0167-577x(02)01419-2
Fu, Yongqing, Du, Hejun (2003) Effects of film composition and annealing on residual stress evolution for shape memory TiNi film. Materials Science and Engineering: A, 342. 236-244 doi:10.1016/s0921-5093(02)00285-x
Fu, Yongqing, Du, Hejun (2003) RF magnetron sputtered TiNiCu shape memory alloy thin film. Materials Science and Engineering: A, 339. 10-16 doi:10.1016/s0921-5093(02)00130-2
Liu, Dongping, Zhang, Sam, Ong, Soon-Eng, Benstetter, Günther, Du, Hejun (2006) Surface and electron emission properties of hydrogen-free diamond-like carbon films investigated by atomic force microscopy. Materials Science and Engineering: A, 426. 114-120 doi:10.1016/j.msea.2006.03.092
Fu, Yongqing, Du, Hejun (2001) Effects of the counterface materials on the tribological characteristics of CNX coating deposited on plasma-nitrided Tiî—¸6Alî—¸4V. Materials Science and Engineering: A, 298. 16-25 doi:10.1016/s0921-5093(00)01372-1
Wang, Z.G., Zu, X.T., Fu, Y.Q. (2005) Study of incomplete transformations of near equiatomic TiNi shape memory alloys by DSC methods. Materials Science and Engineering: A, 390. 400-403 doi:10.1016/j.msea.2004.08.010
Zhang, H.J., Qiu, C.J. (2006) Characterization and MEMS application of low temperature TiNi(Cu) shape memory thin films. Materials Science and Engineering: A, 438. 1106-1109 doi:10.1016/j.msea.2006.01.114
Fu, Yongqing, Du, Hejun (2003) Journal of Materials Science Letters, 22 (7) Springer Science and Business Media LLC. 531-533 doi:10.1023/a:1022942504615
Karakalos, S., Siokou, A., Ladas, S. (2009) The interfacial properties of MgCl2 films grown on a flat SiO2/Si substrate. An XPS and ISS study. Applied Surface Science, 255. 8941-8946 doi:10.1016/j.apsusc.2009.06.105
Ma, E. (2005) Growth of amorphous silicide during Ti/Si interfacial reactions in multilayer thin films. Materials Science and Engineering: A, 398. 60-65 doi:10.1016/j.msea.2005.02.059
Hao, Junying, Xu, Tao, Liu, Weimin (2005) Preparation and characterization of hydrogenated carbon nitride films synthesized by dual DC-RF plasma system. Materials Science and Engineering: A, 408. 297-302 doi:10.1016/j.msea.2005.08.146
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: September 11, 2025 00:55:21
Go to top of page