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Ramana, J. V., Raju, V. S., Gangadharan, S. (1997) Thin film characterisation using backscattering spectrometry. Journal of Radioanalytical and Nuclear Chemistry, 217. 293-295 doi:10.1007/bf02034459

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Reference TypeJournal (article/letter/editorial)
TitleThin film characterisation using backscattering spectrometry
JournalJournal of Radioanalytical and Nuclear Chemistry
AuthorsRamana, J. V.Author
Raju, V. S.Author
Gangadharan, S.Author
Year1997 (March)Volume217
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf02034459Search in ResearchGate
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Mindat Ref. ID10080265Long-form Identifiermindat:1:5:10080265:2
GUID0
Full ReferenceRamana, J. V., Raju, V. S., Gangadharan, S. (1997) Thin film characterisation using backscattering spectrometry. Journal of Radioanalytical and Nuclear Chemistry, 217. 293-295 doi:10.1007/bf02034459
Plain TextRamana, J. V., Raju, V. S., Gangadharan, S. (1997) Thin film characterisation using backscattering spectrometry. Journal of Radioanalytical and Nuclear Chemistry, 217. 293-295 doi:10.1007/bf02034459
In(n.d.) Journal of Radioanalytical and Nuclear Chemistry Vol. 217. Springer Science and Business Media LLC

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Kumar, Sanjiv, Ramana, J. V., Kumar, S. Vikram, Raju, V. S. (2005) Application of backscattering spectrometry for composition and thickness determination of zirconium oxide layers on autoclaved zircaloy. Journal of Radioanalytical and Nuclear Chemistry, 265. 441-446 doi:10.1007/s10967-005-0846-y
Ramana, J. V., Raju, V. S., Ray, A. K., Gangadharan, S., Srinivasa, R. S., Chandorkar, A. N. (1993) Determination of the stoichiometry of vanadium nitride films by proton back-scattering. Journal of Radioanalytical and Nuclear Chemistry Articles, 174 (2). 265-270 doi:10.1007/bf02037913
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